guide to thin section microscopy - Mineralogical Society of America
guide to thin section microscopy - Mineralogical Society of America
guide to thin section microscopy - Mineralogical Society of America
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Guide <strong>to</strong> Thin Section Microscopy<br />
Double refraction<br />
Retardation refers <strong>to</strong> the accumulated distance between the wave front <strong>of</strong> the fast wave<br />
(correlating with n x ') and that <strong>of</strong> the slow wave (correlating with n z ') by the time the slow<br />
wave reaches the crystal surface. As both waves revert back <strong>to</strong> identical wave velocity after<br />
leaving the crystal, retardation remains constant in the microscope from that point onwards,<br />
unless these light waves pass through another crystal (which they do if an accessory plate is<br />
inserted; see Ch. 4.2.4). In <strong>thin</strong> <strong>section</strong> <strong>microscopy</strong>, retardation is expressed in nm. In<br />
macroscopic crystals, retardation can be in the order <strong>of</strong> millimetres. Taking calcite as an<br />
example, O-wave and E-wave passing through a cleavage rhombohedron <strong>of</strong> 2 cm thickness<br />
have accumulated a retardation <strong>of</strong> 1.84 mm as they exit the crystal (light path orthogonal <strong>to</strong><br />
rhomb faces).<br />
The amount <strong>of</strong> retardation is determined by two fac<strong>to</strong>rs, (1) the difference between the two<br />
wave velocities, or expressed differently, by the birefringence value (∆n = n z ' – n x ') <strong>of</strong> the<br />
particular crystal <strong>section</strong> observed; and (2) by the thickness (d) <strong>of</strong> the crystal plate in the <strong>thin</strong><br />
<strong>section</strong>. Thus, Γ = d * (n z ' – n x ').<br />
The distance between bot<strong>to</strong>m and <strong>to</strong>p <strong>of</strong> the crystal plate (i.e., thickness d) can also be<br />
expressed as multiples <strong>of</strong> wavelengths (d = m*λ). As light <strong>of</strong> an initial wavelength λ i enters<br />
the crystal, two waves with different wavelengths are generated (slow wave: λ z' = λ i /n z' ; fast<br />
wave: λ x' = λ i /n x' ). If d is expressed as multiples <strong>of</strong> λ z' and λ x' , we get<br />
d = m 1 *λ z' = m 2 *λ x' or m 1 = d/λ z' and m 2 = d/λ x'<br />
Retardation is the difference between the multipliers m 1 and m 2 , multiplied by wavelength λ i :<br />
Γ = (m 1 – m 2 ) * λ i .<br />
Note that by the time the slow wave reaches the upper crystal surface, the fast wave has<br />
reverted <strong>to</strong> λ i and travelled the distance Γ outside the crystal.<br />
Thus, Γ = (d/λ z' – d/λ x' ) * λ i<br />
as λ z' = λ i /n z' and λ x' = λ i /n x' ,<br />
Γ = (d * n z' /λ i – d * n x' /λ i )∗λ i = d * (n z' - n x' ).<br />
Raith, Raase & Reinhardt – February 2012<br />
After leaving the crystal, the two waves with amplitudes a 1 and a 2 enter the analyzer with the<br />
retardation obtained wi<strong>thin</strong> the crystal plate. As shown by vec<strong>to</strong>r decomposition (Fig. 4-24)<br />
two waves <strong>of</strong> the same wavelength but reduced amplitudes (a 1 ' and a 2 ') come <strong>to</strong> lie in the<br />
analyzer's plane <strong>of</strong> polarization. The orthogonally oriented wave components are blocked by<br />
the analyzer. The relative amplitudes a 1 ' and a 2 ' <strong>of</strong> the transmitted waves depend entirely on<br />
the orientation <strong>of</strong> the vibration directions with respect <strong>to</strong> the polarizer and analyzer directions.<br />
They have their minimum (zero) in the dark image (= extinction) position and reach their<br />
maximum after rotation <strong>of</strong> 45° from the extinction position, in the diagonal position (Figs. 4-<br />
23, 4-24).<br />
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