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guide to thin section microscopy - Mineralogical Society of America

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Guide <strong>to</strong> Thin Section Microscopy<br />

Double refraction<br />

As the light waves enter the analyzer, they are reduced <strong>to</strong> their analyzer-parallel components,<br />

and are thus subject <strong>to</strong> interference. The amount <strong>of</strong> retardation controls whether two related<br />

waves obliterate each other completely, or whether they generate a resulting wave with an<br />

amplitude from any<strong>thin</strong>g above zero <strong>to</strong> maximum height (Fig. 4-25). It is important here <strong>to</strong><br />

appreciate the conditions for constructive and destructive interference <strong>of</strong> originally orthogonal<br />

waves which interfere in the analyzer (Figs. 4-24, 4-25) as opposed <strong>to</strong> the simple case<br />

<strong>of</strong> interference <strong>of</strong> two waves vibrating in a single plane (cf. Fig. 4-1).<br />

Considering interference <strong>of</strong> light waves in the N-S transmission direction <strong>of</strong> the analyzer, two<br />

extreme cases can be distinguished:<br />

Case A: If the retardation <strong>of</strong> the two waves corresponds <strong>to</strong> a phase shift <strong>of</strong> zero or wholenumber<br />

multiples <strong>of</strong> λ, the condition <strong>of</strong> complete destructive interference is realized. The<br />

analyzer-parallel wave components <strong>of</strong> this particular wavelength vibrate in opposite directions<br />

and hence obliterate each other. No light is passing the analyzer (Fig. 4-25A).<br />

Case B: If the retardation <strong>of</strong> the two waves corresponds <strong>to</strong> a phase shift <strong>of</strong> λ/2 or odd-number<br />

multiples <strong>of</strong> λ/2, the condition <strong>of</strong> maximum constructive interference is realized. The<br />

analyzer-parallel wave components <strong>of</strong> this particular wavelength vibrate parallel (“in phase”)<br />

and thus are superimposed <strong>to</strong> form an interference wave <strong>of</strong> maximum amplitude (i.e.,<br />

maximum light intensity). The light is completely transmitted by the analyzer (Fig. 4-25B), if<br />

absorption effects <strong>of</strong> the polarizing filter are disregarded.<br />

For any retardation between these extremes the intensity <strong>of</strong> the light transmitted by the<br />

analyzer is reduced <strong>to</strong> a certain degree, depending on the exact phase shift (e.g., 50% for ¼ λ<br />

and ¾ λ). If monochromatic light was used, mineral grains <strong>of</strong> variable orientation in a <strong>thin</strong><br />

<strong>section</strong> would show different levels <strong>of</strong> brightness, between black and maximum brightness, as<br />

∆n depends on crystal orientation, and retardation is a function <strong>of</strong> ∆n (Γ = d*∆n; d = const).<br />

Mineral grains with wedging-out edges would show a bright-and-dark-striped pattern corresponding<br />

<strong>to</strong> a continuous variation in Γ relating <strong>to</strong> the change in d (∆n = const).<br />

Crystal <strong>section</strong>s observed in white light under crossed polarizers appear in characteristic<br />

interference colours that vary only in intensity as the microscope stage is turned, as long as<br />

the mineral is in an <strong>of</strong>f-extinction position (Fig. 4-26).<br />

Raith, Raase & Reinhardt – February 2012<br />

Figure 4-26. Interference colour <strong>of</strong> a forsterite crystal as the stage is rotated from the extinction<br />

position in<strong>to</strong> a 45° diagonal position. The interference colour does not change during<br />

rotation, but its intensity does. In the crystal <strong>section</strong> parallel (100) birefringence is (n y –n x ) =<br />

0.015 and retardation thus amounts <strong>to</strong> 25*10 3 nm * 0.015 = 375 nm.<br />

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