ISOCAM Interactive Analysis User's Manual Version 5.0 - ISO - ESA

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134 CHAPTER 14. IMAGE ANALYSIS AND DISPLAY number. If the IMAGE has had no dark correction or is badly dark corrected a regular saw-tooth pattern will be easily discernible in the lines away from any source signal. If the CUBE has good dark correction then the plot should just reveal background noise. • Stabilisation: CAM’s CCD detectors can be slow to stabilise when the intensity of the incident light changes. This is most evident when a strong source comes in to a pixel’s FOV. In x3d click on the button temporal cut andthenonanybrightpixelintheimage window. If the pixel contains a glitch, then you may see that it takes several read-outs to recover. If the pixel contains a source then it is very likely that you will see a slow response or transient behaviour in the pixel to the source detection. If the PDS has been calibrated, without transient fitting, i.e. with s90 or m90, then click on the button mask to look at pixels flagged in the MASK 5 . The detected unstable pixels and dead pixels (column 24 in the LW detector) will now be marked in the plot window. If calibration has been performed well then only those pixels which exhibit transient behaviour will be masked. Other methods of stabilisation which involve transient fitting, i.e. fs, inv and vision, may flag pixels in the MASK that are to be discarded in future analysis and modify other unstable pixels in the CUBE. The flagged or masked pixels can of course still be seen by clicking on mask and the temporal behaviour of the modified pixels of the CUBE can be compared with that of the unmodified CUBE. • Glitches: Looking at any single 2D CAM image it may be easy to confuse a glitch with a source. However, if you look at the temporal behaviour of a pixel in the IMAGEs accrued by CAM in a STATE (i.e. DATA in an SCD), or in the CUBE from a PDS, then glitches are usually easily distinguishable from sources. A CAM observation may be made of many STATEs, each STATE containing many IMAGEs of the same sky position. In principle, when CAM is pointing at a source then source signal will be present in all the IMAGEs of that particular STATE, but most glitches are of such a transient nature that their duration will be quite short, though intense, appearing in one or possibly a few IMAGEs. 6 Therefore in most cases, sources will appear in temporal space as relatively low-intensity long duration signal and glitches will appear as spiky intense events. Click on temporal cut. Scroll through the images of the CUBE until you find an IMAGE containing a pixel of high intensity. Click on the pixel and a plot of its history will appear in the plot window. The shape of the plot should reveal whether the selected pixel of the current IMAGE was hit by a cosmic ray or is a source detection. A well deglitched CUBE will have few or no spiky pixels. Glitches can be manually removed by clicking on the button glitch and then clicking on a pixel in the image with the middle mouse button. The selected pixel will be masked and the MASK will be automatically updated (note that the MASK should not be supplied to x3d as an expression if the update is to be saved). See Section 20.2.2 for alternative manual deglitching methods within CIA. Note that there are two other manual deglitchers, man mask and sl viewcube, inthecontrib directory of CIA. 5 If !mask=1 (complex) then all instances of non-zero mask are indicated 6 All of this depends of course on such factors as the integration time, the number of frames per state, the response of detector to the source and the intensity of the glitch.
14.4. CUBE ANALYSIS 135 Figure 14.10: xv temp window. 14.4.7 xv temp xv temp is yet another tool for examining cubes. It does however offer different functionality from x3d and xcube. It can be invoked simply as: CIA> xv_temp, any_pds.cube, to=any_pds.to Take a look at Figure 14.10. Note the following points: • The image displayed is the mean of all the IMAGEs in any pds.cube. A white box surrounds a feature in this image – we will call the pixels enclosed within this box the region. • The position of the region can be changed by clicking anywhere on the image. Clicking the button max will centre the region on the image pixel of maximum intensity. The buttons marked 1x1, 3x3, etc., can be used to quickly set the size of the region. Alternatively, more customized sizes can be set with the sliders. • A plot of the history of each pixel in the region will be displayed by clicking on the button display. There are two possible plot types: overlay of all histories (click on single) or individual pixel history plots (click on multi).
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ISOCAM Interactive Analysis User’
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Michael Rupen (NRAO) Jaqui Sam Lone
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vi CONTENTS 8 Polarization observat
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viii CONTENTS 14.4.6 x3d as a calib
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x CONTENTS 19.3 A beam-switch obser
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xii CONTENTS B CIA command short-li
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xiv CONTENTS
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xvi LIST OF FIGURES 14.13The raster
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xviii LIST OF FIGURES
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xx LIST OF TABLES
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2 CHAPTER 1. ABOUT THE CIA USER’S
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4 CHAPTER 2. ABOUT CIA 2.2 System r
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6 CHAPTER 2. ABOUT CIA Figure 2.2:
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8 CHAPTER 2. ABOUT CIA In addition,
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10 CHAPTER 2. ABOUT CIA 2.3.4 Custo
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12 CHAPTER 2. ABOUT CIA LOG Log fil
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14 CHAPTER 2. ABOUT CIA This will p
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16 CHAPTER 2. ABOUT CIA % device, p
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18 CHAPTER 2. ABOUT CIA
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Introduction The Quick Start Guide
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24 CHAPTER 3. RASTER OBSERVATION (C
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32 CHAPTER 4. STARING OBSERVATION (
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34 CHAPTER 4. STARING OBSERVATION (
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36 CHAPTER 5. SOLAR SYSTEM OBJECT O
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42 CHAPTER 6. BEAM-SWITCH OBSERVATI
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48 CHAPTER 7. CVF OBSERVATION (CAM0
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50 CHAPTER 7. CVF OBSERVATION (CAM0
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52 CHAPTER 8. POLARIZATION OBSERVAT
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Introduction The purpose of Part II
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62 CHAPTER 9. THE DATA PRODUCTS AND
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68 CHAPTER 10. FIRST LOOK AT THE DA
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74 CHAPTER 11. INTRODUCTION TO CIA
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76 CHAPTER 11. INTRODUCTION TO CIA
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78 CHAPTER 12. DATA SLICING 3. At t
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80 CHAPTER 12. DATA SLICING CIA> ns
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82 CHAPTER 12. DATA SLICING equal t
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Page 179 and 180: Introduction The purpose of this pa
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15.5. PREPARED DATA STRUCTURE (PDS)
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Chapter 16 Data structure manipulat
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16.1. CIA DATA STRUCTURE INTERFACE
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16.1. CIA DATA STRUCTURE INTERFACE
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16.2. AN EXAMPLE OF SAD MANIPULATIO
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16.4. MANIPULATING THE MASK 195 and
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16.5. CDS DATA EXTRACTION 197 16.5
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16.6. MANIPULATING CIA DATA STRUCTU
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Chapter 17 Importing ISO data produ
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17.2. IMPORTING FITS TO REGULAR IDL
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Chapter 18 Export of CIA data struc
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18.3. EXPORT FOR ARCHIVING 207 CIA>
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Part IV Advanced Use of CIA 209
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212
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214 CHAPTER 19. ADVANCED SLICING 19
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216 CHAPTER 19. ADVANCED SLICING Fi
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226 CHAPTER 19. ADVANCED SLICING va
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228 CHAPTER 19. ADVANCED SLICING Fo
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230 CHAPTER 19. ADVANCED SLICING
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232 CHAPTER 20. ADVANCED DATA CALIB
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274 CHAPTER 21. USING SLICE WITHIN
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294 CHAPTER 22. SECOND ORDER CORREC
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296 CHAPTER 22. SECOND ORDER CORREC
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298 CHAPTER 23. X CIA REFERENCE GUI
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306 APPENDIX A. GLOSSARY beam-switc
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308 APPENDIX A. GLOSSARY FITS (data
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310 APPENDIX A. GLOSSARY raster dat
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312 APPENDIX A. GLOSSARY
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314 APPENDIX B. CIA COMMAND SHORT-L
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320 APPENDIX C. THE ISO CD-ROM C.2.
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322 APPENDIX C. THE ISO CD-ROM Vari
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324 APPENDIX D. GUIDELINES FOR WRIT
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326 APPENDIX D. GUIDELINES FOR WRIT
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328 APPENDIX E. ISOCAM ASTROMETRY:
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338 APPENDIX F. WHAT IS NEW IN CIA
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344 APPENDIX G. WARNING MESSAGES IN
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346 APPENDIX H. PATCHED ASTROLIB AN
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348 APPENDIX I. UPGRADING OLD CIA S
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350 APPENDIX I. UPGRADING OLD CIA S
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352 APPENDIX J. REPORTING PROBLEMS
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354 APPENDIX K. TECHNICAL REPORTS S
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356 BIBLIOGRAPHY Okumura K., 1998,
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