ISOCAM Interactive Analysis User's Manual Version 5.0 - ISO - ESA

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154 CHAPTER 14. IMAGE ANALYSIS AND DISPLAY CIA> ps_open, /portrait, /color, /encapsulated Any plotting routine that does not specify a window can be used to direct output to idl.ps. CIA> contour, raster_pds.raster The following call to ps print will rename idl.ps to raster.ps and print it to a printer named e15 – deleting the old file in the process. CIA> ps_print, ’raster’, /delete, printer=’e15’ 14.8.1 Avoiding postscript problems In this section we will address some problems which are commonly experienced when printing to IDL the postscript device. • Because postscript device pixels are scalable, any output graphics will expand to fill the entire postscript device area. This means that a square image on your screen could end up as a rectangle in your postscript file. • Modifying the colour table (by using XLOADCT for example) can mess up the IDL’s internal colour table. This can give unexpected results when you output colour graphics to the postscript device. The above problems can be avoided by following the procedure in the example below. 1. Create a new window by calling WINDOW with keyword retain set to 2. CIA> window, 1, retain=2 2. Display your image. CIA> tviso, image Modify the colour table (with XLOADCT) asyoudesire. 3. Save the displayed image using TVRD. CIA> image_get = tvrd(1) 4. Now open the postscript device CIA> set_plot, ’PS’ Determine the graphic size. CIA> ss = size( image_get ) CIA> x = ss[1] CIA> y = ss[2]
14.8. REDIRECTING GRAPHICS TO THE POSTSCRIPT DEVICE 155 If x is greater then y then CIA> device, xsize=n*x/y, ysize=n, yoffset=27-n, bits=8, /color where n is less then 27 cm. If x is less then y then CIA> device, xsize=n, ysize=n*y/x, yoffset=27-(n*y/x), bits=8, /color where n is less then 18 cm. The DEVICE keywords xsize, ysize and offset determine the x-axis size, y-axis size and offset from (0, 0) of the postscript device area. The keyword color is set for obvious reasons. 5. Output the graphic CIA> tv, image_get 6. Close the postscript device. CIA> device, /close CIA> set_plot, ’x’
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ISOCAM Interactive Analysis User’
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Michael Rupen (NRAO) Jaqui Sam Lone
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vi CONTENTS 8 Polarization observat
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viii CONTENTS 14.4.6 x3d as a calib
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x CONTENTS 19.3 A beam-switch obser
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xii CONTENTS B CIA command short-li
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xiv CONTENTS
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xvi LIST OF FIGURES 14.13The raster
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xviii LIST OF FIGURES
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xx LIST OF TABLES
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2 CHAPTER 1. ABOUT THE CIA USER’S
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4 CHAPTER 2. ABOUT CIA 2.2 System r
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6 CHAPTER 2. ABOUT CIA Figure 2.2:
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8 CHAPTER 2. ABOUT CIA In addition,
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10 CHAPTER 2. ABOUT CIA 2.3.4 Custo
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12 CHAPTER 2. ABOUT CIA LOG Log fil
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14 CHAPTER 2. ABOUT CIA This will p
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16 CHAPTER 2. ABOUT CIA % device, p
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18 CHAPTER 2. ABOUT CIA
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Introduction The Quick Start Guide
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24 CHAPTER 3. RASTER OBSERVATION (C
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32 CHAPTER 4. STARING OBSERVATION (
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34 CHAPTER 4. STARING OBSERVATION (
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36 CHAPTER 5. SOLAR SYSTEM OBJECT O
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42 CHAPTER 6. BEAM-SWITCH OBSERVATI
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48 CHAPTER 7. CVF OBSERVATION (CAM0
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50 CHAPTER 7. CVF OBSERVATION (CAM0
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52 CHAPTER 8. POLARIZATION OBSERVAT
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Introduction The purpose of Part II
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62 CHAPTER 9. THE DATA PRODUCTS AND
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68 CHAPTER 10. FIRST LOOK AT THE DA
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74 CHAPTER 11. INTRODUCTION TO CIA
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76 CHAPTER 11. INTRODUCTION TO CIA
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78 CHAPTER 12. DATA SLICING 3. At t
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80 CHAPTER 12. DATA SLICING CIA> ns
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82 CHAPTER 12. DATA SLICING equal t
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84 CHAPTER 12. DATA SLICING OR CIA>
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86 CHAPTER 12. DATA SLICING 70 16.0
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88 CHAPTER 12. DATA SLICING • Sel
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90 CHAPTER 12. DATA SLICING We sugg
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92 CHAPTER 12. DATA SLICING title d
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94 CHAPTER 12. DATA SLICING • Sel
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96 CHAPTER 13. DATA CALIBRATION 13.
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98 CHAPTER 13. DATA CALIBRATION •
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100 CHAPTER 13. DATA CALIBRATION 13
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102 CHAPTER 13. DATA CALIBRATION 13
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Page 179 and 180: Introduction The purpose of this pa
Page 181 and 182: Chapter 15 CIA data structure high-
Page 183 and 184: 15.2. OBSERVATION DATA STRUCTURES 1
Page 191 and 192: 15.3. CALIBRATION DATA STRUCTURE (C
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Page 209 and 210: 16.1. CIA DATA STRUCTURE INTERFACE
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Page 213 and 214: 16.2. AN EXAMPLE OF SAD MANIPULATIO
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Chapter 18 Export of CIA data struc
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18.3. EXPORT FOR ARCHIVING 207 CIA>
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Part IV Advanced Use of CIA 209
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212
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214 CHAPTER 19. ADVANCED SLICING 19
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216 CHAPTER 19. ADVANCED SLICING Fi
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226 CHAPTER 19. ADVANCED SLICING va
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228 CHAPTER 19. ADVANCED SLICING Fo
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230 CHAPTER 19. ADVANCED SLICING
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232 CHAPTER 20. ADVANCED DATA CALIB
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274 CHAPTER 21. USING SLICE WITHIN
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294 CHAPTER 22. SECOND ORDER CORREC
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296 CHAPTER 22. SECOND ORDER CORREC
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298 CHAPTER 23. X CIA REFERENCE GUI
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306 APPENDIX A. GLOSSARY beam-switc
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308 APPENDIX A. GLOSSARY FITS (data
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310 APPENDIX A. GLOSSARY raster dat
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312 APPENDIX A. GLOSSARY
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314 APPENDIX B. CIA COMMAND SHORT-L
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320 APPENDIX C. THE ISO CD-ROM C.2.
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322 APPENDIX C. THE ISO CD-ROM Vari
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324 APPENDIX D. GUIDELINES FOR WRIT
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326 APPENDIX D. GUIDELINES FOR WRIT
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328 APPENDIX E. ISOCAM ASTROMETRY:
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338 APPENDIX F. WHAT IS NEW IN CIA
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344 APPENDIX G. WARNING MESSAGES IN
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346 APPENDIX H. PATCHED ASTROLIB AN
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348 APPENDIX I. UPGRADING OLD CIA S
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350 APPENDIX I. UPGRADING OLD CIA S
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352 APPENDIX J. REPORTING PROBLEMS
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354 APPENDIX K. TECHNICAL REPORTS S
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356 BIBLIOGRAPHY Okumura K., 1998,
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