ISOCAM Interactive Analysis User's Manual Version 5.0 - ISO - ESA

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310 APPENDIX A. GLOSSARY raster data structure See PDS. raster (observation) A particular CONFIGURATION of CAM AOT#1. A raster is performed when CAM makes a series of regularly spaced pointings on the sky, allowing a MOSAIC to be constructed of a region of sky greater then CAM’s FOV. Reference fields See beam-switch observation. RESET This refers to a CAM CCD read-out (i.e. FRAME) taken before integration begins. (see MOSAIC.) revolution (number) An orbit of ISO. The Revolution Number identifies a particular orbit. SAD Science Analysed Data. A CIA data structure used to hold a CIA computed EXPO- SURE (see origin SAD) or MOSAIC (see future SAD), or similar data from the AAR data products. saturation Occurs when a CAM detector is exposed to a bright object and pixels reach their full well capacity. Sensitivity of affected pixels can seriously be altered for succeeding observations. See entry for CLEAN. SCD Science CAM Data. Comes in two flavours: ERD SCD and SPD SCD. The former is a data structure used to hold EOI and RESET FRAMES from the CIER and the latter to hold either CIA computed IMAGEs or IMAGEs from the CISP. slicing Slicing data refers to the CIA process of producing SPD SCDs(one per STATE) and SSCDs (one per CONFIGURATION) from the bulk AOT data contained in the CISP or CIER data products. SPD (level) Standard Processed Data. SPD level refers to the pipeline level of processing that produces SPD. For CAM, SPD is synonymous with CISP. SSAD Set of Science Analysed Data. A data structure cataloging SADs from an AOT or any subset of an AOT, e.g. a CONFIGURATION. SSCD Set of Science CAM Data. A data structure cataloging SCDs from an AOT or CON- FIGURATION. staring (observation) A particular CONFIGURATION of CAM AOT#1. A staring observation is simply one pointing of CAM. STATE The finest time division of CAM activities and a subdivision of an OP-MODE. All CAM parameters are fixed during a STATE, but parameters may change between STATEs. This depends on the observation type: • beam-switch (AOT#3), raster and micro-scan (AOT#1) –CAMpointing changes with STATE • CVF (AOT#4) – CVF position changes with STATE. • polarization (AOT#5) – the entrance wheel changes with STATE. TDF Telemetry Distribution File (or FORMAT). The data-stream down-linked from ISO.
311 TDT (sequence number) Target Dedicated Time. The contiguous time spent on the observation of a source in an ISO revolution (including integration time and overhead times.) An AOT is a subset of a TDT. The TDT sequence number identifies a TDT within a revolution. Combination of TDT number and OSN number. Uniquely identifies an AOT. tracking (observation) A particular CONFIGURATION of CAM AOT#1. A tracking observation is used for observing Solar System objects. CAM pointing changes to track the target object.
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ISOCAM Interactive Analysis User’
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Michael Rupen (NRAO) Jaqui Sam Lone
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vi CONTENTS 8 Polarization observat
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viii CONTENTS 14.4.6 x3d as a calib
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x CONTENTS 19.3 A beam-switch obser
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xii CONTENTS B CIA command short-li
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xiv CONTENTS
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xvi LIST OF FIGURES 14.13The raster
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xviii LIST OF FIGURES
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xx LIST OF TABLES
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2 CHAPTER 1. ABOUT THE CIA USER’S
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4 CHAPTER 2. ABOUT CIA 2.2 System r
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6 CHAPTER 2. ABOUT CIA Figure 2.2:
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8 CHAPTER 2. ABOUT CIA In addition,
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10 CHAPTER 2. ABOUT CIA 2.3.4 Custo
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12 CHAPTER 2. ABOUT CIA LOG Log fil
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14 CHAPTER 2. ABOUT CIA This will p
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16 CHAPTER 2. ABOUT CIA % device, p
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18 CHAPTER 2. ABOUT CIA
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Introduction The Quick Start Guide
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24 CHAPTER 3. RASTER OBSERVATION (C
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32 CHAPTER 4. STARING OBSERVATION (
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34 CHAPTER 4. STARING OBSERVATION (
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36 CHAPTER 5. SOLAR SYSTEM OBJECT O
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42 CHAPTER 6. BEAM-SWITCH OBSERVATI
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48 CHAPTER 7. CVF OBSERVATION (CAM0
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50 CHAPTER 7. CVF OBSERVATION (CAM0
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52 CHAPTER 8. POLARIZATION OBSERVAT
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Introduction The purpose of Part II
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62 CHAPTER 9. THE DATA PRODUCTS AND
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68 CHAPTER 10. FIRST LOOK AT THE DA
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74 CHAPTER 11. INTRODUCTION TO CIA
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76 CHAPTER 11. INTRODUCTION TO CIA
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78 CHAPTER 12. DATA SLICING 3. At t
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80 CHAPTER 12. DATA SLICING CIA> ns
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82 CHAPTER 12. DATA SLICING equal t
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84 CHAPTER 12. DATA SLICING OR CIA>
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86 CHAPTER 12. DATA SLICING 70 16.0
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88 CHAPTER 12. DATA SLICING • Sel
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90 CHAPTER 12. DATA SLICING We sugg
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92 CHAPTER 12. DATA SLICING title d
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94 CHAPTER 12. DATA SLICING • Sel
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96 CHAPTER 13. DATA CALIBRATION 13.
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98 CHAPTER 13. DATA CALIBRATION •
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100 CHAPTER 13. DATA CALIBRATION 13
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104 CHAPTER 13. DATA CALIBRATION Fi
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106 CHAPTER 13. DATA CALIBRATION au
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108 CHAPTER 13. DATA CALIBRATION 2.
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114 CHAPTER 14. IMAGE ANALYSIS AND
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Introduction The purpose of this pa
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Chapter 15 CIA data structure high-
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15.2. OBSERVATION DATA STRUCTURES 1
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15.3. CALIBRATION DATA STRUCTURE (C
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15.4. AUXILIARY CALIBRATION DATA 17
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15.4. AUXILIARY CALIBRATION DATA 17
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15.5. PREPARED DATA STRUCTURE (PDS)
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Chapter 16 Data structure manipulat
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16.1. CIA DATA STRUCTURE INTERFACE
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16.1. CIA DATA STRUCTURE INTERFACE
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16.2. AN EXAMPLE OF SAD MANIPULATIO
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16.4. MANIPULATING THE MASK 195 and
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16.5. CDS DATA EXTRACTION 197 16.5
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16.6. MANIPULATING CIA DATA STRUCTU
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Chapter 17 Importing ISO data produ
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17.2. IMPORTING FITS TO REGULAR IDL
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Chapter 18 Export of CIA data struc
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18.3. EXPORT FOR ARCHIVING 207 CIA>
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Part IV Advanced Use of CIA 209
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212
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214 CHAPTER 19. ADVANCED SLICING 19
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216 CHAPTER 19. ADVANCED SLICING Fi
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230 CHAPTER 19. ADVANCED SLICING
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232 CHAPTER 20. ADVANCED DATA CALIB
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Page 318 and 319: 298 CHAPTER 23. X CIA REFERENCE GUI
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Page 348 and 349: 328 APPENDIX E. ISOCAM ASTROMETRY:
Page 358 and 359: 338 APPENDIX F. WHAT IS NEW IN CIA
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Page 366 and 367: 346 APPENDIX H. PATCHED ASTROLIB AN
Page 368 and 369: 348 APPENDIX I. UPGRADING OLD CIA S
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Page 372 and 373: 352 APPENDIX J. REPORTING PROBLEMS
Page 374 and 375: 354 APPENDIX K. TECHNICAL REPORTS S
Page 376 and 377: 356 BIBLIOGRAPHY Okumura K., 1998,
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