ISOCAM Interactive Analysis User's Manual Version 5.0 - ISO - ESA

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162 CHAPTER 15. CIA DATA STRUCTURE HIGH-LEVEL ARCHITECTURE single STATE and in addition parameters describing that STATE, e.g. coordinates, lens, filter, etc. . . . The SPD SCD differs primarily in that it holds IMAGEs which have been computed from the EOI and RESET FRAMEs. These IMAGEs are either directly taken from the CISP data product or computed by CIA from the FRAMEs in the ERD SCD. See also Section 15.2.2. Set of Science CAM Data (SSCD) The SSCD is primarily designed to catalogue a set of SCDs (either ERD SCDs or SPD SCDs, but not both together) belonging to the same CONFIGURATION and variables which describe that CONFIGURATION. However, it may be used to catalogue any number of STATEs: from all the STATEs in a AOT down to a single STATE. See also Section 15.2.3. Science Analysed Data (SAD) – AAR Level Contains two EXPOSUREs, one calibrated in detector coordinates (from the CCIM data product) and the other calibrated in celestial coordinates (from the CMAP data product). The SAD is also used to hold EXPOSUREs (from the CMOS data product). In addition to AAR data products, the SAD may be used to hold CIA calibrated EXPOSUREs and MOSAICs. See also Section 15.2.4. Set of Science Analysed Data (SSAD) Contains a catalogue of a set of SADs. Its function is analogous to that of the SSCD. In general, best use of the SSAD is made when it catalogues SADs that belong to a single CONFIGURATION. However, it may catalogue any subset of SADs from an AOT. See also Section 15.2.5. Diagnostic Specific Data (DSD) Contains physical parameters of the camera: temperatures, voltages, wheel positions, etc. It is directly used only by instrument experts for in-depth investigation of ISOCAM behaviour. Such data that is of interest to the normal user is also held in the SCD. Documentation of the DSD structure is beyond the scope of the CIA User’s Manual 1 . 15.2.1 Standard fields of observation data structures There is some similarity between observation data structures in their architecture, that is to say standard fields exist in all. Generally, they contain information which is relevant to each data structure, e.g. it is necessary to know the PFOV during an observation whether you have raw FRAMES in a ERD SCD or calibrated IMAGEs in a SAD, but it is not necessary to keep RESET FRAMEs in the SAD. This section describes these standard fields. Later sections describe fields particular to each data structure. 1. NAME: The data structure name is unique to each data structure. The name is used to store the structure on disk and as a pointer to the structure in memory. If you use x slicer to slice your data then you have some choice in the selection of your own naming scheme, see Section 12.3.7. Otherwise, if you are creating the data structures using IDL conversion routines of Chapter 17 then each data structure is named by either one of two conventions, as follows. If the TDT and OSN is defined then the following convention is followed: CDDDttttttooccss yymmddhhmmssdd where, 1 Further details on the DSD may be found in the ISO Data Product Document or the CAM Parameter Characteristic Document, 1991, ref ISOCAM ST110.
15.2. OBSERVATION DATA STRUCTURES 163 variable DDD tttttt oo cc ss yy mm dd hh mm ss dd definition structure type abbreviated name, i.e. SCD, SAD, SSC(D), SSA(D) TDT number observation sequence number configuration number state number year of creation month of creation day of creation hour of creation minute of creation second of creation 0.01 second of creation Otherwise, if neither TDT or OSN is defined then the convention is: CDDDYYMMDDHHMMSS yymmddhhmmssdd where, variable definition DDD YY MM DD HH MM SS yy mm dd hh mm ss dd structure type abbreviated name, i.e. SCD, SAD, SSC(D), SSA(D) UTC at beginning of data (year) UTC at beginning of data (month) UTC at beginning of data (day) UTC at beginning of data (hour) UTC at beginning of data (minute) UTC at beginning of data (second) year of creation month of creation day of creation hour of creation minute of creation second of creation 0.01 second of creation 2. AOCT: AOT number. Type: integer. This field can have the following values: value description 0 CUS use only 1 CAM01: staring, raster, micro-scan or tracking 2 CAM02: not used (historic reasons only) 3 CAM03: beam-switch 4 CAM04: cvf 5 CAM05: polarization
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ISOCAM Interactive Analysis User’
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Michael Rupen (NRAO) Jaqui Sam Lone
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vi CONTENTS 8 Polarization observat
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viii CONTENTS 14.4.6 x3d as a calib
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x CONTENTS 19.3 A beam-switch obser
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xii CONTENTS B CIA command short-li
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xiv CONTENTS
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xvi LIST OF FIGURES 14.13The raster
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xviii LIST OF FIGURES
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xx LIST OF TABLES
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2 CHAPTER 1. ABOUT THE CIA USER’S
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4 CHAPTER 2. ABOUT CIA 2.2 System r
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6 CHAPTER 2. ABOUT CIA Figure 2.2:
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8 CHAPTER 2. ABOUT CIA In addition,
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10 CHAPTER 2. ABOUT CIA 2.3.4 Custo
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12 CHAPTER 2. ABOUT CIA LOG Log fil
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14 CHAPTER 2. ABOUT CIA This will p
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16 CHAPTER 2. ABOUT CIA % device, p
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18 CHAPTER 2. ABOUT CIA
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Introduction The Quick Start Guide
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24 CHAPTER 3. RASTER OBSERVATION (C
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32 CHAPTER 4. STARING OBSERVATION (
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34 CHAPTER 4. STARING OBSERVATION (
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36 CHAPTER 5. SOLAR SYSTEM OBJECT O
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42 CHAPTER 6. BEAM-SWITCH OBSERVATI
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48 CHAPTER 7. CVF OBSERVATION (CAM0
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50 CHAPTER 7. CVF OBSERVATION (CAM0
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52 CHAPTER 8. POLARIZATION OBSERVAT
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Introduction The purpose of Part II
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62 CHAPTER 9. THE DATA PRODUCTS AND
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68 CHAPTER 10. FIRST LOOK AT THE DA
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74 CHAPTER 11. INTRODUCTION TO CIA
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76 CHAPTER 11. INTRODUCTION TO CIA
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78 CHAPTER 12. DATA SLICING 3. At t
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80 CHAPTER 12. DATA SLICING CIA> ns
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82 CHAPTER 12. DATA SLICING equal t
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84 CHAPTER 12. DATA SLICING OR CIA>
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86 CHAPTER 12. DATA SLICING 70 16.0
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88 CHAPTER 12. DATA SLICING • Sel
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90 CHAPTER 12. DATA SLICING We sugg
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92 CHAPTER 12. DATA SLICING title d
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94 CHAPTER 12. DATA SLICING • Sel
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96 CHAPTER 13. DATA CALIBRATION 13.
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98 CHAPTER 13. DATA CALIBRATION •
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100 CHAPTER 13. DATA CALIBRATION 13
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104 CHAPTER 13. DATA CALIBRATION Fi
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106 CHAPTER 13. DATA CALIBRATION au
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108 CHAPTER 13. DATA CALIBRATION 2.
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Page 179 and 180: Introduction The purpose of this pa
Page 181: Chapter 15 CIA data structure high-
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212
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214 CHAPTER 19. ADVANCED SLICING 19
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216 CHAPTER 19. ADVANCED SLICING Fi
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226 CHAPTER 19. ADVANCED SLICING va
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228 CHAPTER 19. ADVANCED SLICING Fo
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230 CHAPTER 19. ADVANCED SLICING
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232 CHAPTER 20. ADVANCED DATA CALIB
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274 CHAPTER 21. USING SLICE WITHIN
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294 CHAPTER 22. SECOND ORDER CORREC
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296 CHAPTER 22. SECOND ORDER CORREC
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298 CHAPTER 23. X CIA REFERENCE GUI
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306 APPENDIX A. GLOSSARY beam-switc
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308 APPENDIX A. GLOSSARY FITS (data
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310 APPENDIX A. GLOSSARY raster dat
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312 APPENDIX A. GLOSSARY
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314 APPENDIX B. CIA COMMAND SHORT-L
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320 APPENDIX C. THE ISO CD-ROM C.2.
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322 APPENDIX C. THE ISO CD-ROM Vari
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324 APPENDIX D. GUIDELINES FOR WRIT
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326 APPENDIX D. GUIDELINES FOR WRIT
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328 APPENDIX E. ISOCAM ASTROMETRY:
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338 APPENDIX F. WHAT IS NEW IN CIA
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344 APPENDIX G. WARNING MESSAGES IN
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346 APPENDIX H. PATCHED ASTROLIB AN
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348 APPENDIX I. UPGRADING OLD CIA S
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350 APPENDIX I. UPGRADING OLD CIA S
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352 APPENDIX J. REPORTING PROBLEMS
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354 APPENDIX K. TECHNICAL REPORTS S
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356 BIBLIOGRAPHY Okumura K., 1998,
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