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Thesis High-Resolution Photoemission Study of Kondo Insulators ...

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7.3. Results and Discussion 103<br />

Intensity<br />

Intensity<br />

Intensity<br />

18 K<br />

75 K<br />

150 K<br />

225 K<br />

297 K<br />

18 K<br />

75 K<br />

150 K<br />

225 K<br />

298 K<br />

18 K<br />

75 K<br />

150 K<br />

225 K<br />

295 K<br />

FeSi<br />

Fe 0.9 Co 0.1 Si<br />

Au<br />

-40 -20 0 20 40<br />

Energy relative to E F (meV)<br />

Figure 7.5: <strong>Photoemission</strong> spectra <strong>of</strong> FeSi, Fe0.9Co0.1Si and Au taken at different temperatures.<br />

edge. However, the edge at 18 K appears again closer to EF than that at 75 K, questioning<br />

the simple interpretation <strong>of</strong> the leading edge shift with temperature. Another<br />

possibility is a reduction <strong>of</strong> the DOS at EF with decreasing temperature, which could<br />

lead to the apparent shift <strong>of</strong> the leading edge as observed experimentally. The difficulty<br />

to distinguish between the two possible scenarios <strong>of</strong> the spectral changes with temperature<br />

comes from the difficulty to extract changes in the DOS itself apart from the<br />

temperature dependence <strong>of</strong> the Fermi-Dirac distribution function. Therefore, we have<br />

divided the photoemission spectra by the Fermi-Dirac distribution function (convoluted<br />

with a Gaussian corresponding to the instrumental resolution) [7.20]. This method gives<br />

reliable results in cases where the DOS has only broad structures near EF : application<br />

<strong>of</strong> this method to the spectra <strong>of</strong> Au yields a reasonably flat DOS as shown in the

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