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Thesis High-Resolution Photoemission Study of Kondo Insulators ...

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8.3. Results and Discussion 115<br />

8.3 Results and Discussion<br />

Intensity (arb. units)<br />

FeSi 1-x Al x<br />

hν = 40.8 eV<br />

7 K<br />

x = 0.00<br />

x = 0.02<br />

x = 0.05<br />

x = 0.10<br />

x = 0.30<br />

-10 -8 -6 -4 -2 0<br />

Energy relative to E F (eV)<br />

Figure 8.3: <strong>Photoemission</strong> spectra <strong>of</strong> FeSi1−xAlx taken with He II. A rise below ∼−<br />

7 eV in the x = 0.02 spectrum might be due to signal from a Cu plate on which the<br />

sample is mounted since the size <strong>of</strong> the x = 0.02 sample was comparable to the spot<br />

size <strong>of</strong> the He lamp.<br />

Figure 8.3 shows He II spectra <strong>of</strong> FeSi1−xAlx in a wide energy range1 . The valence<br />

band <strong>of</strong> FeSi1−xAlx, including that <strong>of</strong> FeSi0.70Al0.30, is almost identical with that <strong>of</strong> FeSi.<br />

Substitution dependence appears in the high-resolution He I spectra shown in Fig. 8.4.<br />

The spectra have been normalized to the intensity below − 0.4 eV. We have subtracted<br />

1 In the case <strong>of</strong> Fe1−xCoxSi, He II (hν = 40.8 eV) spectra agreed with He I (hν = 21.2 eV) spectra.<br />

He I spectra below ∼−8 eV, where the kinetic energy <strong>of</strong> emitted photoelectrons is rather low, were<br />

not perfectly reproducible using the Omicron analyzer and thus we used the He II line to observe the<br />

entire valence band.

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