Thesis High-Resolution Photoemission Study of Kondo Insulators ...
Thesis High-Resolution Photoemission Study of Kondo Insulators ...
Thesis High-Resolution Photoemission Study of Kondo Insulators ...
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5.3. Results and Discussion 71<br />
cently, it was found by Takeda et al. [5.23] that Ce3Bi4Pt3 exhibited a sharp depression<br />
<strong>of</strong> the DOS at EF as in the present case <strong>of</strong> YbB12. The magnitude <strong>of</strong> the depression<br />
is smaller than that <strong>of</strong> YbB12, corresponding to the weaker temperature dependence <strong>of</strong><br />
the electrical resistivity in Ce3Bi4Pt3[5.24].<br />
DOS<br />
σ (mΩ -1 cm -1 )<br />
1.0<br />
0.9<br />
0.8<br />
0.7<br />
0.6<br />
10<br />
8<br />
6<br />
4<br />
2<br />
0<br />
0<br />
50<br />
100<br />
150<br />
T (K)<br />
YbB 12<br />
200<br />
-100 meV<br />
-50 meV<br />
-20 meV<br />
-10 meV<br />
-0 meV<br />
Figure 5.5: Top: spectral DOS <strong>of</strong> YbB12 at several energy positions as a function<br />
<strong>of</strong> temperature. Bottom: electrical conductivity <strong>of</strong> the same sample as a function <strong>of</strong><br />
temperature.<br />
In Fig. 5.5 the spectral DOS at several energies are plotted as a function <strong>of</strong> temperature<br />
and are compared with the dc electrical conductivity. All the intensities are<br />
normalized at 305 K. A decrease in the intensity from 75 K to 6 K, which is expected<br />
from the dc conductivity, is present only in the vicinity (within ∼ 10 meV) <strong>of</strong> EF .For<br />
250<br />
300