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Thesis High-Resolution Photoemission Study of Kondo Insulators ...

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7.3. Results and Discussion 105<br />

DOS<br />

297 K<br />

225 K<br />

150 K<br />

75 K<br />

18 K<br />

293 K<br />

225 K<br />

150 K<br />

75 K<br />

18 K<br />

298 K<br />

225 K<br />

150 K<br />

75 K<br />

18 K<br />

FeSi<br />

Fe 0.95 Co 0.05 Si<br />

Fe 0.90 Co 0.10 Si<br />

295 K<br />

225 K<br />

150 K<br />

75 K<br />

18 K<br />

Au<br />

-100 -80 -60 -40 -20 0 20<br />

Energy relative to E F (meV)<br />

Figure 7.6: Temperature-dependent spectral DOS <strong>of</strong> Fe1−xCoxSi and Au obtained by<br />

dividing the photoemission spectra by the Fermi-Dirac distribution function convoluted<br />

with a Gaussian function.<br />

that the low-energy (< 30 meV) or low-temperature (< 200 K) electronic structure is<br />

strongly affected by the small amount <strong>of</strong> Co substitution in contrast to the high-energy<br />

or high-temperature electronic structure. This is consistent with the recent transport<br />

and optical study <strong>of</strong> Fe1−xCoxSi [7.21]: the gap size deduced from the optical conductivity<br />

and the high-temperature (130

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