Thesis High-Resolution Photoemission Study of Kondo Insulators ...
Thesis High-Resolution Photoemission Study of Kondo Insulators ...
Thesis High-Resolution Photoemission Study of Kondo Insulators ...
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120 Chapter 8. Temperature and Al-Substitution Dependence <strong>of</strong> the ...<br />
Difference DOS<br />
(a) (b)<br />
295 K<br />
x = 0.00<br />
x = 0.02<br />
x = 0.05<br />
x = 0.10<br />
x = 0.30<br />
7 K<br />
-250-200-150-100 -50 0<br />
Energy relative to E F (meV)<br />
295 K<br />
225 K<br />
150 K<br />
75 K<br />
7 K<br />
x = 0.00<br />
x = 0.30<br />
-250-200-150-100 -50 0<br />
Energy relative to E F (meV)<br />
Figure 8.8: Difference DOS <strong>of</strong> FeSi1−xAlx from the DOS <strong>of</strong> FeSi0.70Al0.03 at 7 K. (a)<br />
Temperature dependence for each composition, T = 7 K (thick curve), 75 K, 150 K,<br />
225 K, and 295 K from bottom. (b) Substitution dependence at each temperature. The<br />
thick solid curves represent the DOS <strong>of</strong> the x = 0 sample, the dashed curves x = 0.02,<br />
the thick curves x = 0.05, the dot-dashed curves x = 0.10, and the solid dashed curves<br />
x = 0.30.