Thesis High-Resolution Photoemission Study of Kondo Insulators ...
Thesis High-Resolution Photoemission Study of Kondo Insulators ...
Thesis High-Resolution Photoemission Study of Kondo Insulators ...
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90 Chapter 6. Substitution and Temperature Dependence <strong>of</strong> the Conduction ...<br />
including a formation <strong>of</strong> the narrow gap.<br />
On the other hand, the larger pseudogap <strong>of</strong> ∼ 0.1 eV does not show even a linear<br />
x-dependence, indicating that it is principally the electronic structure in LuB12 and is<br />
not strongly deformed by the existence <strong>of</strong> the Yb 4f states. Near EF , the depression <strong>of</strong><br />
the larger pseudogap with temperature is stronger, but its x dependence is qualitatively<br />
different from that at EF .<br />
depressed DOS (arb. units)<br />
0<br />
Yb 1-xLu xB 12<br />
DOS(300 K) - DOS(7 K)<br />
0.2<br />
0.4<br />
x<br />
0.6<br />
- 0 meV<br />
- 20 meV<br />
- 50 meV<br />
- 80 meV<br />
Figure 6.11: Depression in the spectral DOS in going 300 K to 7 K, plotted against the<br />
Lu content. The DOS values have been read from Fig. 6.9, not from Fig. 6.10<br />
In order to extract the effect <strong>of</strong> Lu substitution, we have subtracted the 7 K spectral<br />
DOS <strong>of</strong> LuB12 from all the other spectral DOS as shown in Fig. 6.12. Figure 6.12<br />
(a) exhibits the temperature dependence <strong>of</strong> the difference DOS for each sample. The<br />
depression <strong>of</strong> the DOS at EF in going from 300 K to 7 K occurs almost in the same way<br />
for x = 1.00, 0.75, and 0.50 samples although the DOS at each temperature is slightly<br />
lowered in going from x = 1.00 to 0.50 as shown in Fig. 6.12 (b). The depression at<br />
EF in going from 300 K to 7 K is enhanced for x = 0.25 and 0.00 and a simple linear<br />
interpolation <strong>of</strong> the DOS at EF between x = 0.00 and x = 1.00 does not represent<br />
0.8<br />
1.0