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Epitaxy and interface defects

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hsl 2007 – Structure of imperfect materials – <strong>Epitaxy</strong> <strong>and</strong> <strong>interface</strong> <strong>defects</strong><br />

<strong>Epitaxy</strong> modes<br />

(a) (b) (c)<br />

Growth temperature (°C)<br />

Epitaxial nucleation modes in heteroepitaxy:<br />

a) layer-by-layer, b) Stranski–Krastanov, <strong>and</strong> c) clustered.<br />

Clustered growth<br />

Planar growth<br />

Germanium fraction x<br />

Measurements of clustered vs. layerby-layer<br />

growth in the Si 1 − x Ge x /Si<br />

(001) system for molecular beam<br />

epitaxy.<br />

[Bean et al. 1984]<br />

10

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