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Epitaxy and interface defects

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(a)<br />

(b)<br />

2.5 Sources of misfit dislocations<br />

h > h crit<br />

h > h crit<br />

hsl 2007 – Structure of imperfect materials – <strong>Epitaxy</strong> <strong>and</strong> <strong>interface</strong> <strong>defects</strong><br />

Multiplication mechanisms arising<br />

from dislocation pinning or<br />

interaction<br />

Heterogeneous nucleation at<br />

specific local stress concentrations,<br />

e. g. growth artifacts or substrate<br />

<strong>defects</strong><br />

Homogeneous (spontaneous)<br />

nucleation of dislocation loops<br />

Generation of misfit dislocations from<br />

different sources:<br />

a) the pre-existing threading dislocation<br />

model <strong>and</strong> b) the half-loop generation<br />

from the free surface.<br />

[Zou:01] 21

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