Multipactor in Low Pressure Gas and in ... - of Richard Udiljak
Multipactor in Low Pressure Gas and in ... - of Richard Udiljak
Multipactor in Low Pressure Gas and in ... - of Richard Udiljak
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tipactor events that are short-lived, like e.g. multicarrier multipactor,<br />
where the discharges <strong>of</strong>ten are weak <strong>and</strong> <strong>of</strong> short duration. However,<br />
the method is also sensitive to other sources <strong>of</strong> noise <strong>in</strong> the same way as<br />
close-to-carrier noise <strong>and</strong>, thus, it is not recommended to use only third<br />
harmonic <strong>and</strong> close-to-carrier noise detection <strong>in</strong> a test setup.<br />
Reflected power<br />
Mismatches <strong>in</strong> the transitions between microwave components imply<br />
that some <strong>of</strong> the <strong>in</strong>put power will be reflected. However, <strong>in</strong> a welldesigned<br />
system, very little power is reflected. Components conta<strong>in</strong><strong>in</strong>g<br />
high Q-value parts, like e.g. cavity resonators, are only well matched<br />
at certa<strong>in</strong> frequencies <strong>and</strong> m<strong>in</strong>or changes <strong>in</strong> the component properties<br />
can lead to detun<strong>in</strong>g <strong>of</strong> the part. <strong>Multipactor</strong> is known to be able to<br />
detune high Q-value components [70]. Thus the reflected power from<br />
a component can be used as an <strong>in</strong>dication <strong>of</strong> a multipactor event. To<br />
study the absolute value <strong>of</strong> the reflected power is usually not a good way<br />
<strong>of</strong> detection, s<strong>in</strong>ce the <strong>in</strong>put power can vary dur<strong>in</strong>g a multipactor test<br />
<strong>and</strong> consequently the reflected power will vary as well, as the reflected<br />
power is a fixed fraction <strong>of</strong> the <strong>in</strong>put power. This fraction is called the<br />
return loss <strong>and</strong> is commonly measured <strong>in</strong> decibel. The return loss will be<br />
a stable value, <strong>in</strong>sensitive to power fluctuations, until the component is<br />
detuned. Figure 6.3 shows an example where both close-to-carrier noise<br />
<strong>and</strong> the return loss are monitored simultaneously dur<strong>in</strong>g a multipactor<br />
test. Both methods <strong>in</strong>dicate a change around t = 50 s <strong>and</strong> thus it can<br />
be determ<strong>in</strong>ed with great confidence that a multipactor discharge was<br />
<strong>in</strong>itiated at that time.<br />
The ma<strong>in</strong> advantage with this method is that it is quite reliable <strong>and</strong><br />
there is little risk that other phenomena will cause a mismatch that can<br />
be confused with multipactor. However, for low Q-value components or<br />
badly matched systems, the sensitivity <strong>of</strong> the method is low.<br />
Electron monitor<strong>in</strong>g<br />
A new global method <strong>of</strong> detection was presented at the 4 th International<br />
Workshop on <strong>Multipactor</strong>, Corona <strong>and</strong> Passive Intermodulation<br />
<strong>in</strong> Space RF Hardware [71]. It is called the Electron Density Detection<br />
Method, abbreviated EDDM, <strong>and</strong> uses a set <strong>of</strong> tri-axial cables as<br />
a probe <strong>and</strong> electrons picked up by the probe are then monitored with<br />
a high precision electron meter. The data is collected us<strong>in</strong>g a computer<br />
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