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Coater/Developer Evolution or Revolution? - Sematech

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TEL FIRM Impact on Pattern Collapse<br />

Coat freeze<br />

LLE L/S Patterning<br />

DIW Rinse Surfactant Rinse<br />

~170 defects<br />

due to pattern collapse<br />

~0 defects<br />

due to pattern collapse<br />

TEL FIRM has demonstrated effectiveness across multiple LLE<br />

processes.<br />

Data courtesy of IMEC<br />

Reference: Towards 26nm hp: Advances in Litho<br />

Process Litho; P. Wong

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