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DESIGN, ASSEMBLY AND CHARACTERIZATION OF COMPOSITE ...

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Figure 5.11 show a scanning electron micrograph of the material interface<br />

between sintered BT:Ni=2:3 Ni(m) and pure BT filaments. The specimen is remained<br />

unpolished for observation. The up-left portion of the SEM image shows the BT:Ni=2:3<br />

Ni(m) and the lower-right portion is the BT phase.<br />

Figure 5.11 scanning electron micrograph of the BT:Ni=2:3 Ni(m) and pure BT interface<br />

for the composite lattice.<br />

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