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course contents - ug - National Institute of Technology Karnataka

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NATIONAL INSTITUTE OF TECHNOLOGY KARNATAKA, SURATHAKAL<br />

-----------------------------------------------------------------------------------------------------------------dynamics;<br />

Virial theorem; Hamilton � Jacobi equations; Action angle variables; Poisson Brackets;<br />

Integral invariants; Stretched elastic string; Energy momentum relations.<br />

PH251 ELECTRICAL PROPERTIES OF MATERIALS (3-0-0) 3<br />

Conductivity <strong>of</strong> metals-classical free electron theory and quantum free electron theory, Semiconductors -<br />

pure and impure semiconductors, band model, conductivity and its temperature dependence, Hall effect,<br />

Direct and indirect bandgap semiconductors, p-n junction and diode equation, Dielectric properties <strong>of</strong><br />

insulators-dielectric behaviour in static and alternating fields, dipolar relaxation and dielectric loss,<br />

ferroelectric and piezoelectric materials.<br />

Electrical Engineering Materials – A.J.Dekkar, Prentice Hall India Publ.<br />

Solid state Electronic Devices – B.G. Streetman, Prentice Hall India Publ.<br />

PH252 ELECTROMAGNETIC THEORY (3-0-0) 3<br />

Electrostatics: electrostatic field, Divergence and Curl <strong>of</strong> electric field, Electric potential. Laplace�s<br />

equation in three dimetians. Separation <strong>of</strong> variables. Electrosatic field in Matter Electric displacement.<br />

Magnetostatic , Lorentz force law, Biot-Savarts law, Divergence and Curl <strong>of</strong> Magnetic field, Ampere�s<br />

law. Electromotive force Faraday�s law, Maxwell�s Equations plane wave solutions <strong>of</strong> Maxwell�s<br />

equations, Poynting vector, wave propagation thro<strong>ug</strong>h a boundary, reflection, refraction, absorption and<br />

skin depth.<br />

D. Griffiths, Introduction to Electrodynamics, 2 nd ed., Prentice Hall, 1989.<br />

William H. Hayt . Engineering Electromagnetics, 5 th ed. Tata Mc Graw Hill Publishing Company Ltd.<br />

PH301 SEMICONDUCTOR PHYSICS (3-0-0) 3<br />

Review <strong>of</strong> atomic structure and statistical mechanics : Schrodinger wave equation- Particle in a periodic<br />

potential well. Crystalline and amorphous; inorganic and organic; elemental and compound<br />

semiconductors. Band models. Impurities and Defects. Bulk and thin film techniques. E-k diagrams,<br />

effective mass and mobility. Temperature dependence. Degenerate and non-degenerate semiconductors.<br />

Fermi level and impurity levels, Equilibrium and non-equilibrium characteristics. Carrier transport<br />

phenomena, Electrical conductivity, Temperature dependence, Conductivity in a magnetic field, Hall<br />

effect. Thermal Conductivity, Thermoelectric power. Optical and dielectric properties. Refractive index,<br />

Transmission and reflection, Debye length, photoconductivity and photovoltaic effect. Oxidation<br />

methods, Diffusion, Ion implantation, Metallization and Etching processes. Measurement techniques:<br />

Resistivity, energy gap, thermal conductivity, film thickness and carrier mobility.<br />

Donald A Neamen, Semiconductor Physics and Devices-Basic Principles.<br />

Helmut F Wolf, Semiconductors.<br />

M.S. Thyagi, Semiconductor Materials and Devices.<br />

S Mahajan and K S Sree Harsha, Principles <strong>of</strong> Growth and Processing <strong>of</strong> Semiconductors.<br />

S.M. Sze, Physics <strong>of</strong> Semiconductor Devices.<br />

David H Ferray, Electronic materials and Devices.<br />

Jasprit Singh, Semiconductor Optoelectronics and <strong>Technology</strong><br />

PH302 X-RAYS AND CRYSTALLOGRAPHY (3-0-0) 3<br />

Crystal structure- crystal systems, Bravais lattices, Miller indices, inter planar spacing, atomic packing<br />

factor, structure <strong>of</strong> NaCI, CsCI, ZnS and diamond. Symmetry considerations- rotational and translational<br />

symmetries, angle between planes and directions, reciprocal lattice and its relation to diffraction patterns.<br />

X-rays- production, continuous and characteristic x-rays, properties, diffraction <strong>of</strong> x-rays, Bragg�s law,<br />

Bragg�s spectrometer, Laue diffraction technique and Debye-Scherrer method <strong>of</strong> structure analysis.<br />

Elements <strong>of</strong> x-ray crystallography – L. V. Azar<strong>of</strong>f, McGraw Hill publ.<br />

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NITK-Course Contents(UG)2010 Page 125 <strong>of</strong> 134

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