course contents - ug - National Institute of Technology Karnataka
course contents - ug - National Institute of Technology Karnataka
course contents - ug - National Institute of Technology Karnataka
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NATIONAL INSTITUTE OF TECHNOLOGY KARNATAKA, SURATHAKAL<br />
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PH351 PHYSICS OF SEMICONDUCTOR DEVICES (3-0-0) 3 PREREQ: PH301<br />
The PN Junction Diode, basic device technology, current-voltage characteristics, Transient behaviour and<br />
noise. Heterojunction. Bipolar transistor- static characteristics. Microwave and power transistor and<br />
related devices. Metal-semiconductor contacts. Energy band relation, transport processes, barrier height<br />
JFET and MESFET basic device characteristics. Microwave performance. MOSFET-Device structure and<br />
characteristics, Nonvolatile memory devices Tunnel Diode, IMPATT and related transit-time diodes.<br />
Transferred-electron devices- Gunn effect. Principles <strong>of</strong> photonic devices: LEDs, semiconductor lasers;<br />
photodetectors � photodiodes and APDs. Solar Cells.<br />
S.M. Sze, Physics <strong>of</strong> Semiconductor Devices.<br />
Donald A Neamen, Semiconductor Physics and Devices-Basic Principles<br />
M.S. Thyagi, Semiconductor Materials and Devices.<br />
David H Ferray, Electronic materials and Devices<br />
Jasprit Singh, Semiconductor Optoelectronics and <strong>Technology</strong>.<br />
PH352 VACUUM TECHNOLOGY AND THIN FILMS (3-0-0) 3<br />
Production <strong>of</strong> vacuum � mechanical pumps, sorption pumps and cryogenic pumps. Measurement <strong>of</strong><br />
vacuum � thermal conductivity ga<strong>ug</strong>es and ionization ga<strong>ug</strong>es. Behaviour <strong>of</strong> gases at low pressure. Thin<br />
films � methods <strong>of</strong> preparation � vacuum evaporation, sputtering, electro-deposition, chemical deposition.<br />
Properties <strong>of</strong> thin films. Measurement <strong>of</strong> film thickness, Applications <strong>of</strong> thin films.<br />
Handbook <strong>of</strong> thin film technology – L. I. Maissel and R. Glang, McGraw Hill publ.<br />
PH401 OPTOELECTRONICS (3-0-0) 3<br />
Light Propagation in material media. Maxwell�s equations, Wave equations for dielectrics, Polarization.,<br />
reflection and refraction <strong>of</strong> light from dielectric interfaces, total internal reflection, light propagation in<br />
uniaxial crystals. Nonlinear polarizability <strong>of</strong> material media, second harmonic generation <strong>of</strong> light, optical<br />
rectification, frequency conversion by 3-wave mixing, parametric oscillators. Optical wave guides-<br />
Types <strong>of</strong> optical wave guides, guided modes in planar wave guides, guided modes in step-index optical<br />
fibers. Attenuation and dispersion. Directional couplers, prism couplers. Mach-Zehnder interferometer,<br />
Optical sources and detectors - light absorption and emission in semiconductors, structure, working and<br />
operating characteristics <strong>of</strong> heterojunction LED�s laser diodes, photodiodse and APDs. Noise in<br />
photodiodse, Electro-optic effect, longitudinal and transeverse electro-optic modulators. Acousto-optic<br />
effect, Bragg diffraction. Photonic switching and optical bistability.<br />
B E Saleh & M.C. Teich, Fundamentals <strong>of</strong> Photonics.<br />
J Wilson & J F B Hawkes, Optoelectronics - an Introduction<br />
Jasprit Singh, Optoelectronics: An introduction to Materials & Devices<br />
P. Bhattacharya, Semiconductor Optoelectronics.<br />
PH402 EXPERIMENTAL TECHNIQUES FOR CHARACTERISATION OF<br />
MATERIALS (3-0-0) 3<br />
Metallographic Techniques � Optical Microscopy, Image Analysis. Diffraction Method. Crystallographic<br />
Texture, Measurement and Analysis, X-ray diffraction residual stress techniques, Neutron Diffraction.<br />
Resonance Methods. Electron Optical Methods, Spectroscopy and Other Methods, Atomic Absorption,<br />
X-ray, Infrared, Raman Spectroscopy, Atom Probe Micro-analysis.<br />
Edington J.W., Practical Electron Microscopy, Vol-01.<br />
A. Goldstein, Introduction to Scanning Electron Microscopy<br />
B.D. Cullity, Metals Handbook, Vol. 10.Elements <strong>of</strong> X-ray diffraction.<br />
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