vrouw maria, tutkija nano- kuljetin pronssi- linnut - Kemia-lehti

Bruker AXSBruker AXS NordicXRD X-ray DiffractionD2 Phaser : Fast Table Top X-ray DiffractometerXRF X-ray FluorescenceS8 Dragon : New Simultaneous X-ray Spectrometers.Elements from Boron to Uranium simultaneousμXRF Micro XRFM4 Tornado : 25 μm lateral resolutionSEM-EDSX-Flash 5000 : Up to 3 million counts/sekProducts :Chemical AnalysisElemental analysis with Optical emission (OES OpticalEmission Spectroscopy), X-ray Fluorescence (XRF X-rayFluorescence) eller Combustian analysis (CHNOS)Känner Du till våra produktområdenCrystallography?Determination of chemical structure in crystallinematerials by X-Ray Diffraction (XRD)Topography AnalysisSurface analysis with Atomic Force Microscopes (AFM)and Stylus Profilometers (SOM)Micro AnalysisEnergy dispersive analysis (EDS) and Electron BackscatterDiffraction (EBSD).μXRF Micro XRFX-ray Flourescence micro analysis with down to 25 μmlateral resolutionBruker AXS Nordic AB Vallgatan 5170 67 SolnaTel: +46 (0)8 655 25 60Fax: +46 (0)8 655 25 98E-Mail: info@bruker-axs.sewww.bruker-axs.seKysy lisää:jyrki.tuominen@bruker-axs.sepuh. 040 152 4262think forwardXRD/XRF/OES/EDS/EBSD/AFM/SOM