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Then kf , expressed in generatiod , wül becorne:<br />

k, = pl%, = In 2 x p ( generation-' ) (4-22)<br />

Eq. (4.22) shows that if the probability <strong>of</strong> piasmid loss @) is constant, kf ( generation" ) is<br />

constant over different dilution rates.<br />

If the difference in specsfic growth rates <strong>of</strong> plasmid-bea~g and plasmid fke ceils<br />

are negligible. the three-parameter model <strong>of</strong> plasmid instabiüty kinetics can be simplified to<br />

a one-panmeter model as foiiows:<br />

X' = x,' eq(-pDt) (43)<br />

X- = X,- + X:[I -eq(-pDt)] (4-24)<br />

For the current recombinant yeast, the probabiiïtyp cm be considered independent <strong>of</strong> the<br />

dilution rate D. In the present case an average value <strong>of</strong> p couid be caiculated as 0.0499.<br />

Based on p = 0.0499. the kst-order decay rate constants for dinerent dilution rates were<br />

calculated and are listed in Table 4.4. Table 4.4 shows good agreement between predicted<br />

values <strong>of</strong> kf and measured vaiues <strong>of</strong> kfi The model can be &O appiied to situations when<br />

probability <strong>of</strong> plasmid los @) is dependent on the dilution rate. For example, Impoolsup<br />

et ai. (1 W b) found that when expressed in units <strong>of</strong> generation-', the vaiues <strong>of</strong> fïrst-onier<br />

decay rate constants (kf) had a tendency to increase with increasing growth rates. It may<br />

be deduced h m Eq. (4.22) that the probability <strong>of</strong> plasmid 10s @) incnased with<br />

increasing dilution rates. Higher instability at higher dilution rate was also reported for

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