Burn-in & Test Socket Workshop - BiTS Workshop

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Model Validation & Performance Examples ▼ Validating the Model ▼ Explain test results ▼ Confirm if contactor will meet customer needs ▼ Identify improvements to contactor ▼ Identify improvements to load board (i.e. pad sizes) ▼ Determine equivalent circuits ▼ Investigate changes to contactors to meet customer specific needs 11
Return Loss (dB) 0 -5 -10 -15 -20 -25 -30 -35 -40 -45 -50 Model Validation & Performance Examples Leaded Series Return Loss (S 11 ) Data Measured Test Data Taken by GigaTest Labs for .010" Thick Contact Equivalent Circuit Modeled Data for .010" Thick Contact Optimum Load Board Layout Match Using HFSS -20 dB Point 10.6 GHz from Measured Data 0 1 2 3 4 5 6 7 8 9 10 Frequency (GHz) 12
Page 1 and 2: Burn-in & Test Socket Workshop IEEE
Page 3 and 4: Burn-in & Test Socket Workshop Tech
Page 5 and 6: Discussion Topics ▼ Modeling & it
Page 7 and 8: Designing Load Boards for Optimal P
Page 9 and 10: Load Board Effects ▼ Things to im
Page 11 and 12: Crosstalk Improvements ▼ Increase
Page 13: Load Board Pad Size and Placement 1
Page 17 and 18: Model Validation & Performance Exam
Page 19 and 20: Model Validation & Performance Exam
Page 21 and 22: Return Loss (dB) 0 -5 -10 -15 -20 -
Page 23 and 24: Conclusion ▼ Modeling trends can
Page 25 and 26: Brief History • Semiconductor man
Page 27 and 28: Today’s evolution of the business
Page 29 and 30: Design Considerations Problem: Lack
Page 31 and 32: Problem: Excessive and undefined co
Page 33 and 34: Problem: Damage to the bottom of th
Page 35 and 36: Problem: After 100,000 plunges, exc
Page 37 and 38: Problem: Plating will wear away, ox
Page 39 and 40: Problem: Usability issues revolving
Page 41 and 42: Coplanar waveguide substrate with g
Page 43 and 44: Fixture time domain is computed fro
Page 45 and 46: S 11 Gated, coplanar substrate elec
Page 47 and 48: Model of Contacts with Effects of H
Page 49 and 50: S 11 of contact region from model C
Page 51 and 52: Accounting for housing effects * *
Page 53 and 54: Economic Benefits: • Increase the
Page 55 and 56: Introduction This presentation summ
Page 57 and 58: Socket Requirements for Testing RF
Page 59 and 60: Qualification Process: Determine pa
Page 61 and 62: Qualification Process: Test Sockets
Page 63 and 64: Mechanical Analysis: Pogo-style soc
Page 65 and 66:
Mechanical Analysis: S-contact sock
Page 67 and 68:
Mechanical Analysis: Low-profile in
Page 69 and 70:
Mechanical Analysis: Conductive ela
Page 71 and 72:
Qualification Process: Test socket
Page 73 and 74:
Qualification Process: Test socket
Page 75 and 76:
Electrical Performance Simulations
Page 77 and 78:
Electrical Performance Simulations
Page 79:
Recognition of Support John Blondi
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Burn-in & Test Socket Workshop - BiTS Workshop

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