Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Problem:<br />
Usability issues revolv<strong>in</strong>g<br />
around scaled down versions of<br />
large designs, first developed<br />
for lower frequency applications<br />
Solution:<br />
Initial Agilent design<br />
consideration<br />
Scaled down spr<strong>in</strong>g<br />
uncoils with use, and can<br />
split the hous<strong>in</strong>g sleeve<br />
reta<strong>in</strong><strong>in</strong>g contam<strong>in</strong>ants<br />
and los<strong>in</strong>g compliance<br />
• The YieldPro Array design<br />
concept is not subject to<br />
problems associated with<br />
scaled down designs<br />
• Performs at high RF and<br />
microwave frequencies <strong>in</strong><br />
demand<strong>in</strong>g applications<br />
Julius Botka<br />
BITS.ppt 10/31/01<br />
Page 16
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