Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Electrical and Mechanical<br />
Performance<br />
Characterization of High<br />
Frequency <strong>Test</strong> <strong>Socket</strong>s<br />
Authors: Dr. Hanyi D<strong>in</strong>g<br />
and Lisa Steckley,<br />
IBM Microelectronics<br />
Presented by: Lisa Steckley