Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Recognition of Support<br />
John Blond<strong>in</strong> – IBM, Front-End-Hardware<br />
Ronald Clarke – IBM, <strong>Test</strong> Applications Eng.<br />
Dr. Hanyi D<strong>in</strong>g – IBM, RF Board Design<br />
John Ferrario – IBM, Manager RF <strong>Test</strong><br />
Development<br />
Gene Patrick – IBM, Front-End Hardware<br />
Kev<strong>in</strong> Potasiewicz – IBM, RF <strong>Test</strong> Eng<strong>in</strong>eer<br />
Randy Wolf – IBM, RF Board Design<br />
March 3-6, 2002 <strong>BiTS</strong> <strong>Workshop</strong> 26
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