Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Introduction<br />
This presentation summarizes the ongo<strong>in</strong>g<br />
work at IBM to understand the factors<br />
affect<strong>in</strong>g both the electrical performance and<br />
mechanical durability of several commercial<br />
RF test sockets.<br />
March 3-6, 2002 <strong>BiTS</strong> <strong>Workshop</strong> 2
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