Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Brief History<br />
• Semiconductor manufacturers and<br />
test houses are required to test<br />
devices with multiple functions<br />
• Packages vary <strong>in</strong> type, size and pitch<br />
• Contactors provide the f<strong>in</strong>al crucial<br />
l<strong>in</strong>k to testers<br />
• First YieldPro contactor patented <strong>in</strong><br />
1997<br />
• Lowest parasitics with<br />
<strong>in</strong>dependently<br />
compliant wip<strong>in</strong>g contacts<br />
Frame and<br />
Slider<br />
mounted on<br />
elastomer<br />
Frame with<br />
slider<br />
<strong>in</strong>serted<br />
Julius Botka<br />
BITS.ppt 10/31/01<br />
• Path length is 0.037”,<br />
performance up to 18GHz<br />
Simple<br />
SOIC-8<br />
Hous<strong>in</strong>g<br />
Page 2
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