Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Conclusion<br />
▼ Model<strong>in</strong>g trends can determ<strong>in</strong>e how to<br />
improve load board layout<br />
▼ Load board layout can greatly affect test data<br />
▼ Good microwave design pr<strong>in</strong>ciples apply to<br />
load board design<br />
▼ Model<strong>in</strong>g and test data have shown that<br />
significant improvement can be atta<strong>in</strong>ed by<br />
better match<strong>in</strong>g load board and contactor<br />
impedance to the Device Under <strong>Test</strong> (DUT)<br />
▼ Ball Series contributions from Quake<br />
Technologies <strong>in</strong>dicated with the Quake logo<br />
20
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