E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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Interesting <strong>Test</strong> Data (2)<br />
Design effort towards DFT:<br />
- From 10% to 40%.<br />
-Variation depending upon nature of IP cores and SOC, extent of re-use, etc.<br />
Time to production:<br />
- Design time: Months.<br />
- <strong>Test</strong> screening / Ramp to production: Also months.<br />
- Fail Pass iterations: Costly. Result in longer manufacturing cycles and<br />
increased time to ramp to volume.<br />
SOCs designs and DSM (deep sub-micron) effects together aggravate problems<br />
in each of the above.
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