E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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Technology and Failure Modes<br />
<strong>Test</strong><br />
complexity<br />
Hookup<br />
tests<br />
Manufacturing<br />
tests / <strong>Test</strong><br />
automation<br />
<strong>Test</strong>s for<br />
better DPPM<br />
screening<br />
Periodic<br />
testing<br />
Board/<br />
External<br />
faults<br />
Stuck-at/<br />
Iddq faults<br />
Layout/<br />
Coupling<br />
faults<br />
Parametric/<br />
Delay faults<br />
Technology scaling / shrinking<br />
Transient<br />
faults