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E0286 – VLSI Test VLSI Test

E0286 – VLSI Test VLSI Test

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Four Quadrant Analysis<br />

II<br />

I<br />

Built-in Self <strong>Test</strong>s<br />

(Structural)<br />

BAD GOOD<br />

Underkill<br />

Yield Loss<br />

III<br />

IV<br />

Units to Ship<br />

Overkill<br />

BAD<br />

GOOD<br />

Traditional <strong>Test</strong>s<br />

(Functional, Parametric, …)

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