E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
SHOW LESS
You also want an ePaper? Increase the reach of your titles
YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.
Cost of <strong>Test</strong>ing<br />
CPUD = ( CTGD + CTBD ) / (TNOD * Y)<br />
CPUD = Cost per unit die.<br />
CTGD = Cost of testing good dies.<br />
CTBD = Cost of testing bad dies. (May be = CTGD in multi-site context).<br />
TNOD = Total number of dies.<br />
Y = Yield.
Change language