E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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Cost Tradeoffs – Example 2<br />
Reduce the time taken for the bad parts to fail. Order the tests based on their<br />
efficiency.<br />
- <strong>Test</strong> A, Yield = 80% (less coverage), Time = 7ms.<br />
- <strong>Test</strong> B, Yield = 60% (more coverage), Time = 8ms.<br />
<strong>Test</strong> A followed by <strong>Test</strong> B:<br />
Total test time = 7 ms + 8x0.8 ms = 13.4 ms.<br />
<strong>Test</strong> B followed by <strong>Test</strong> A:<br />
Total test time = 8 ms + 7x0.6 ms = 12.2 ms
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