E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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DPPM Calculation<br />
The Williams and Brown equation relates the escape rate (DPPM) to the fault<br />
coverage for a given yield.<br />
D = (1 - Y^(1-C)), where<br />
Y = Yield, 0
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