E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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<strong>Test</strong> Power Concerns<br />
Normalized<br />
Power<br />
15<br />
10<br />
5<br />
0<br />
5.2X<br />
Video<br />
Decode<br />
1.7X<br />
<strong>Test</strong> (Pre-<br />
Opt) *<br />
<strong>Test</strong> (with<br />
Opt)<br />
<strong>Test</strong> power can be several times<br />
more than normal mode power<br />
Peak test power issues (IR drop issues)<br />
impact yield<br />
Affects both shift and capture operations.
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