E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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Cost of <strong>Test</strong>ing (2)<br />
Cw = Wafer cost.<br />
D = Dies per wafer.<br />
Y = <strong>Test</strong> yield.<br />
Tg<br />
= <strong>Test</strong> time taken to test a good part.<br />
Tb = Average time it takes for a bad part to fail.<br />
Ctu = <strong>Test</strong>er time cost per unit time.<br />
<strong>Test</strong> time per wafer (Tt) = [D * Y * Tg] + [D * (1-Y) * Tb]<br />
<strong>Test</strong> cost per wafer (Ct) = Ctu * Tt<br />
<strong>Test</strong> cost per good die (Ctg) = Ct / (D * Y)<br />
= Ctu {Tg<br />
+ Tb * [1/Y –1]}<br />
Fabrication cost per good die (Cwg) = Cw / (D * Y)<br />
<strong>Test</strong> cost -> Add costs across different tests / testers.
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