E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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Reducing Cost of <strong>Test</strong>ing<br />
- Target tests on cheaper testers:<br />
- Application costs: $0.01/sec to 0.1/sec and above.<br />
- Actual costs: $ 0.2 M to $ 2 M and above.<br />
- Multi-site testing. Concurrent testing.<br />
- Reduce dependency on tester infrastructure.<br />
- Increase / Reduce the test application speed.<br />
- Improve quality of tests for a given cost. Trade off coverage with quality.<br />
- <strong>Test</strong> sequence: Bad parts to fail early.<br />
- Incur DFT overhead. (Parallel scan, faster scan, test points, BIST, test modes,<br />
isolation, etc.).