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E0286 – VLSI Test VLSI Test

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Reducing Cost of <strong>Test</strong>ing<br />

- Target tests on cheaper testers:<br />

- Application costs: $0.01/sec to 0.1/sec and above.<br />

- Actual costs: $ 0.2 M to $ 2 M and above.<br />

- Multi-site testing. Concurrent testing.<br />

- Reduce dependency on tester infrastructure.<br />

- Increase / Reduce the test application speed.<br />

- Improve quality of tests for a given cost. Trade off coverage with quality.<br />

- <strong>Test</strong> sequence: Bad parts to fail early.<br />

- Incur DFT overhead. (Parallel scan, faster scan, test points, BIST, test modes,<br />

isolation, etc.).

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