E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
E0286 â VLSI Test VLSI Test
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<strong>Test</strong> Components under Multi-site<br />
q <strong>Test</strong> 1: 200 ms.<br />
Die IP Type of <strong>Test</strong><br />
MS<br />
Factor<br />
q <strong>Test</strong>s 2 to N: Less than 20 ms.<br />
X1 X16 X16 -><br />
X64<br />
X16 -><br />
X128<br />
Option 1 220 ms 14 ms NA NA<br />
Option 2 220 ms 1.5 ms 4.5 ms NA<br />
Option 3 SKIP 1.5 ms SKIP 3.25 ms<br />
Single Single Single site<br />
Single Multiple (same) Single site<br />
Single Multiple (different) Single site<br />
Multiple (same) Single Multi-site<br />
Multiple (same) Multiple (same) Multi-site<br />
Multiple (same) Multiple (different) Multi-site<br />
Multiple (different) Single Non-identical<br />
Multiple (different) Multiple (same) Non-identical<br />
Multiple (different) Multiple (different) Non-identical<br />
Multiple insertions required.<br />
<strong>Test</strong> content varies in different insertions.<br />
Selection of test content, test concurrency and multi-site factor important.
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