hbrisc2 - Microelectronics

Hbrisc2 Circuit Validation Strategy: Test ResultsDC parametersSuccessfully passed on Atmel tester: measurements within specification inAID (TNS0211).Dynamic consumption (Core+I/O): < 0.5 WComplete Test report is in TR0024EnvironmentSuccessfully passed on Atmel tester: measurements within specification inAID (TNS0211).Test report in TR0024SEU test plan in VP262 “SEU validation plan”SEU test report in TR0257 “SEU validation report”TN0342-Iss10.pptAll right reserved: Disclosure to third parties of this document or any part thereof, or the use of any information contained therein for purposes other than provided for by this document, is not permitted exceptwith prior and express written permission of S.A.B.C.A.06/12/200429