SEC-400series - Shavo Technologies
SEC-400series - Shavo Technologies
SEC-400series - Shavo Technologies
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47<br />
ANALYSIS<br />
FTIR Gas Analyzers: FG-100 Series<br />
sFTIR gas analyzers<br />
sThe world's smallest size. Easy to move and install on-site, for<br />
a wider variety of analysis uses. sTwo types are available: single cell<br />
and dual cell. The dual cell type can continuously monitor completely<br />
different measurement points, such as the IN and OUT points of<br />
detoxification units, and switch between them with the touch of<br />
a button. There is no need to replace the cells, making gas analysis<br />
even more efficient. sFive cell lengths are available, to allow<br />
measurement of different gas densities. sFeature a gas spectral<br />
library with over 260 types of gases, including PFC gases. Enable<br />
efficient gas analysis. HORIBA STEC also offers calibration curves for<br />
a wide variety of applications. sThanks to their use of a long optical<br />
path length cell that offers high-sensitivity measurement in the sub-<br />
sSample measurement<br />
PFCs<br />
Various process gases<br />
Measurement point<br />
Supplied gas<br />
Process<br />
chamber<br />
Measurement point<br />
Process exhaust gas<br />
Gas spectrum before and after the replacement<br />
of a Pb (C11H19O2)2 bottle<br />
Absorbance<br />
0.005<br />
0<br />
0.005<br />
0<br />
0.005<br />
0<br />
2000<br />
N2<br />
Dry pump<br />
CVD chamber cleaning exhaust gas analysis<br />
Conc. (ppm)<br />
14000<br />
12000<br />
10000<br />
8000<br />
6000<br />
4000<br />
2000<br />
SiF4<br />
Measurement point<br />
Process exhaust gas<br />
Detoxification<br />
unit<br />
sUses<br />
· For optimization of CVD (chamber cleaning, etc.) and dry etching<br />
processes.<br />
· For development of new PFC processing (collection, analysis)<br />
equipment.<br />
· For checking detoxification equipment performance.<br />
· For monitoring quality during gas generation processes.<br />
ppm order, low-density gas measurement is possible (CF4: 0.003<br />
ppm etc.). sUse an electrically cooled MCT detector that does not<br />
require liquid nitrogen. Eliminating the need for complicated liquid<br />
nitrogen supplies in the clean room helps enable continuous, smooth<br />
measurement. sExclusive sampling units available to make sample<br />
gas introduction easy. Also feature casters that make it easier to move<br />
the units, and can be installed in very small spaces. sOptimal software<br />
for real-time analysis: Software designed for real-time analysis features<br />
a measurement results trend display and automatic saving of<br />
measurement results. Simple to operate yet yields high-precision<br />
measurement results. Up to 20 components can be continuously<br />
measured simultaneously. Operates on a Windows notebook PC.<br />
Scrubber<br />
0<br />
0:00<br />
0:15 0:30 0:45 1:00 1:15<br />
Time (h:mm)<br />
Sampling is performed in the CVD chamber's exhaust line (after decompression). The gas density monitor<br />
is used to determine when chamber cleaning should end. Optimizing the cleaning conditions increases<br />
throughput and reduces the amount of gas used.<br />
Before material is replaced<br />
Immediately after<br />
material is replaced<br />
After stabilization<br />
1500 1000 500<br />
Frequency (cm -1 )<br />
NF3<br />
Material<br />
loaded<br />
Exhaust<br />
Gas density monitoring before and after<br />
the replacement of a Pb (C11H19O2)2 bottle<br />
Absorbance/Partial pressure<br />
570 600<br />
0.5<br />
0.4<br />
0.3<br />
0.2<br />
0.1<br />
0<br />
Measurement point<br />
Detoxification exhaust gas<br />
HF<br />
Before material<br />
is replaced<br />
Immediately<br />
after material is replaced<br />
(10<br />
4<br />
-5 )<br />
Deposition rate/Partial pressure<br />
0<br />
0<br />
30 60 90<br />
Bubbling time (hours)<br />
*From the 2002 Spring 49th Proceedings of the Applied Physics Association's<br />
Lecture Series (Tokyo Institute of Technology, HORIBA).<br />
3<br />
2<br />
1<br />
Concentration (ppm)<br />
Detoxification unit (plasma system)<br />
exhaust gas measurement<br />
Concentration (ppm)<br />
5000<br />
4500<br />
4000<br />
3500<br />
3000<br />
2500<br />
2000<br />
1500<br />
Chamber: Plasma on<br />
Abatement: Plasma off<br />
CHF3<br />
Chamber: Plasma on<br />
Abatement: Plasma off<br />
1000<br />
500<br />
0<br />
15:44 15:45 15:46<br />
Time (hh:mm)<br />
15:47 15:48<br />
2500<br />
2000<br />
1500<br />
1000<br />
500<br />
CF4<br />
COF2<br />
RF on<br />
C2F6<br />
sMeasured components and<br />
sample lower detection limits<br />
· For the development of substitute PFC gases.<br />
· For atmospheric gas monitoring in clean rooms.<br />
· For density monitoring of gases produced by liquids and solid<br />
sources used in MOCVD.<br />
· For the evaluation of CVD material properties.<br />
HF<br />
CO<br />
CF4<br />
Dry etching exhaust gas measurement (C2F6)<br />
SiF4<br />
RF off<br />
0<br />
00:00 02:00 04:00 06:00 08:00 10:00 12:00<br />
Time (mm:ss)<br />
Component<br />
CF4<br />
C2F6<br />
C3F8<br />
C4F8<br />
CHF3<br />
NF3<br />
SF6<br />
HF<br />
SiF4<br />
NH3<br />
NO2<br />
CO<br />
Lower detection limit<br />
0.003 ppm<br />
0.005 ppm<br />
0.005 ppm<br />
0.01 ppm<br />
0.009 ppm<br />
0.02 ppm<br />
0.003 ppm<br />
0.25 ppm<br />
0.006 ppm<br />
0.05 ppm<br />
0.04 ppm<br />
0.3 ppm<br />
Measurement conditions:<br />
Cell optical path length 10 m, liquid nitrogen cooled MCT<br />
* Optimizing the measurement conditions enables an increase in sensitivity.