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UNIVERSIT . . AT BONN Physikalisches Institut - Prof. Dr. Norbert ...

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3. CIX 0.2 detector<br />

3.1 Concept<br />

The simultaneously counting and integrating X-ray detector CIX was designed as a merger<br />

of two distinct signal processing concepts that are commonly used in X-ray imaging. The<br />

first concept is the photon counting or pulse mode approach. In this case detectors register<br />

individual photons by means of one or several thresholds. Depending on the number of<br />

thresholds per pixel, these devices permit tissue identification or contrast agent imaging<br />

without a variation of the X-ray beam energy. Regardless of this advantage, current ASIC 1<br />

generations only allow single pulse counting up to rates of approximately 50 Mcps/mm 2 [4]<br />

because of pulse pile-up. Therefore current counting systems are not suited for high flux<br />

applications like computed tomography where the photon rates can exceed 1 Gcps/mm 2 .<br />

In high flux conditions integrating systems are used. These detectors register the total<br />

amount of charge that is deposited inside the sensor instead of identifying individual photons.<br />

Hence, integrators can cope with very large photon fluxes but are on the other hand<br />

limited by electronic noise at low fluxes.<br />

The CIX concept combines the individual advantages of the counting and integrating concepts<br />

in every single pixel cell. By using the photon counter in the low flux regime and by<br />

relying on the integrator data under high flux conditions, CIX offers an increased dynamic<br />

range compared to counting only or integrating only systems. The second advantage of a<br />

simultaneously counting and integrating detector is the ability to reconstruct the average<br />

energy E of the registered photons. This value is obtained by dividing the signal current<br />

I, measured with the integrator, by the number of photons N registered in the counter:<br />

I · Ee/h E =<br />

N · t −1<br />

(3.1)<br />

F rame · e<br />

In this equation Ee/h denotes the electron-hole pair generation energy of the sensor material,<br />

tF rame the measurement duration and e represents the elementary charge. Medical<br />

imaging could profit from this information in terms of an improved image quality as the<br />

average photon energy gives a direct measure of the beam hardening, which, if uncorrected,<br />

leads to unwanted image artifacts. Apart from the large dynamic range and the<br />

measurement of the average photon energy, the CIX detector can also be used for dual<br />

energy imaging, i.e. the reconstruction of the photoelectric and the Compton components<br />

of the total absorption coefficient (see section 2.6). As has been demonstrated in [50], the<br />

noise correlations between the counter and the integrator measurements reduce the image<br />

noise compared to dual energy imaging devices that lack this correlation, e.g. tube energy<br />

switching or dual layer systems.<br />

3.2 CIX 0.2 ASIC specifications<br />

At the moment of writing, the CIX chip is available in its second major revision. The<br />

design of CIX 0.2 introduced a number of changes compared to the predecessor generation<br />

1 ”Application specific integrated circuit”

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