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CH1-silicon wafer & Si epitaxy - KTH

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2B1242 SPRING 2006<br />

LT <strong>epitaxy</strong>:<br />

<strong>Si</strong>Ge epi for base in bipolars, channel for MOS<br />

Example: <strong>KTH</strong> <strong>Si</strong>Ge HBT using NSEG <strong>Si</strong>Ge<br />

p +<br />

Base Emitter Collector<br />

Poly<br />

x-base<br />

<strong>Si</strong>Ge epitaxial base<br />

n -<br />

n+ buried layer<br />

Poly emitter<br />

LTO oxide<br />

LOCOS isolation<br />

Mikael Östling <strong>KTH</strong><br />

P plug<br />

Concentration ( cm -3 )<br />

10 22<br />

10 21<br />

10 20<br />

10 19<br />

10 18<br />

10 17<br />

10 16<br />

Aluminum<br />

Poly<br />

P<br />

B<br />

p +<br />

Epi<br />

Grahn et al SSE’’00<br />

Ge<br />

2<br />

0 1000 2000 3000<br />

Depth<br />

14<br />

12<br />

10<br />

8<br />

6<br />

4<br />

Ge (%)

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