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700 1 $aErickson, Calvin.<br />

700 1 $aRichey, Dave.<br />

700 1 $aChrist, Phil.<br />

700 1 $aTillson, Tim.<br />

700 1 $aMueller, Joseph E.<br />

700 1 $aKwock, Darren.<br />

700 1 $aGeorg, Geri.<br />

700 1 $aLee, Kang.<br />

740 02$aIntroduction to electronic instruments and measurements.<br />

740 02$aCalibration, traceability, and standards.<br />

740 02$aBasic electronic standards.<br />

740 02$aData-acquisition systems.<br />

740 02$aTransducers.<br />

740 02$aAnalog-to-digital converters.<br />

740 02$aSignal sources.<br />

740 02$aMicrowave signal sources.<br />

740 02$aDigital signal processing.<br />

740 02$aEmbedded computers in electronic instruments.<br />

740 02$aPower supplies.<br />

740 02$aInstrument hardware user interfaces.<br />

740 02$aVoltage, current, and resistance measuring instruments.<br />

740 02$aOscilloscopes.<br />

740 02$aPower measurements.<br />

740 02$aOscillators, function generators, frequency and waveform synthesizers.<br />

740 02$aPulse generators.<br />

740 02$aMicrowave signal generators.<br />

740 02$aElectronic counters and frequency and time interval analyzers.<br />

740 02$aPrecision time and frequency sources.<br />

740 02$aSpectrum analyzers.<br />

740 02$aLightwave signal sources.<br />

740 02$aLightwave signal analysis.<br />

740 02$aLightwave component analyzers.<br />

740 02$aOptical time domain reflectometers.<br />

740 02$aImpedance measurement instruments.<br />

740 02$aSemiconductor test instrumentation.<br />

740 02$aNetwork analyzers.<br />

740 02$aLogic analyzers.<br />

740 02$aProtocol analyzers.<br />

740 02$aBit error rate measuring instruments : pattern generators and error detectors.<br />

740 02$aMicrowave passive devices.<br />

740 02$aImpedance considerations.<br />

740 02$aElectrical interference.<br />

740 02$aElectrical grounding.<br />

740 02$aDistributed parameters and component considerations.<br />

740 02$aDigital interface issues.<br />

740 02$aInstrument systems.<br />

740 02$aSwitches in automated test systems.<br />

740 02$aStandards-based modular instruments.<br />

740 02$aSoftware and instrumentation.<br />

740 02$aNetworked connectivity for instruments.<br />

740 02$aComputer connectivity for instruments.<br />

740 02$aGraphical user interfaces for instruments.<br />

740 02$aVirtual instruments.<br />

740 02$aDistributed measurement systems.<br />

740 02$aSmart transducers (sensors or actuators), interfaces, and networks.<br />

830 0$a<strong>McGraw</strong>-<strong>Hill</strong>'s AccessEngineering.<br />

856 40$uhttp://access<strong>eng</strong>ineeringlibrary.com/browse/electronic-instrument-handbook-thirdedition$zSubscription<br />

required<br />

949 $aTK 7878.4 .E55$wLC$c1$i213577-2<strong>001</strong>$d12/30/2011$lMAIN$mMGH$q7$rY$sY$tWEB$u4/24/2007$xENG<br />

997 $a(c)2007 Cassidy Cataloguing Services, Inc.<br />

000 03132cam 2200793 a 4500<br />

<strong>001</strong> ccn00213578<br />

006 m f d<br />

007 cr cn ---<strong>uuauu</strong><br />

<strong>008</strong> 070424s2003 <strong>nyua</strong> <strong>fob</strong>f <strong>001</strong> 0 <strong>eng</strong> d

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