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COST 507 - Repositório Aberto da Universidade do Porto

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AIN and TiNi_ x is also given. Various combinations of different versions of the Ti-Al<br />

and Ti-N binary <strong>da</strong>ta have been tried. Finally, two versions of the present modeling<br />

are offered, based on two versions of the Ti-Al system. The experimental phase<br />

equilibria at 1300°C can be well reproduced. Inconsistencies are detected at lower<br />

temperatures, which are also related to the observed melting behavior of the ternary<br />

compounds. Additional key experiments have been performed by our <strong>COST</strong> partner<br />

(Universität Wien) and the results confirm that previous <strong>da</strong>ta refer to insufficient<br />

equilibration. These inconsistencies and the current approach to determine the Gibbs<br />

energies of the ternary phases in such a complex situation are discussed in detail.<br />

Applications of the developed thermodynamic modeling include: (1) the joining of<br />

A1N with Ti-braze, where also our own thin film experiments on the Ti/AIN<br />

interface reaction are reported, and an interpretation of the diffusion path is given;<br />

(2) diffusion barriers in semiconductor contacts, where an interpretation of the<br />

Al/TiN interface reaction is given; (3) the in-situ synthesis of Al-matrix composites,<br />

strengthened with (TiAl 3 +AlN) reaction products during sintering of Al+TiN powder<br />

mixtures; (4) the formation of mixed AIN-TiN hard coatings and their stabilities with<br />

respect to the pure nitrides; and (5) the nitri<strong>da</strong>tion of Ti-Al alloys. Details are given<br />

in a publication [97Zenl] (see appendix Ilia). Preliminary <strong>da</strong>ta were published in<br />

[96Zen2] (see Appendix Illb).<br />

2.4 Ti-V-N system [97Zen2]<br />

Experimental Ti-V-N phase diagram <strong>da</strong>ta have been thermodynamically assessed and<br />

a consistent set of thermodynamic functions has been developed. Calculations have<br />

been performed to reveal some important features of the system. Problem areas in<br />

experimental <strong>da</strong>ta are indicated. The thermodynamic calculation is linked with<br />

limiting cases for solid state diffusion kinetics. This is applied to a numerical<br />

simulation of ternary solidification processes of Ti-V-N alloys and to a discussion of<br />

nitriding behavior of Ti-V alloys. Details are given in a publication manuscript<br />

[97Zen2] (see appendix IV).<br />

2.5 Al-V-N system [97Du2,3]<br />

Thin film diffusion couples V/A1N have been used to investigate the phase<br />

relationships in the Al-V-N system. The couples were prepared by electron beam<br />

evaporation and annealed at 1000 and 1300°C for 144 and 69 hr., respectively. The<br />

phases were identified by X-ray diffraction. The Al-N-V ternary phase diagram is<br />

calculated from the thermodynamic parameters of the corresponding binary systems.<br />

It is shown that the direct extrapolation from the binary edges can describe the<br />

experimental isothermal section at 1300°C from the literature. For the isothermal<br />

section at 1000°C, however, the extrapolation <strong>do</strong>es not reproduce the reported<br />

A1N+(V)+VN X phase equilibrium. The calculated Al-N-V phase diagram is also<br />

compared with the phase assemblage <strong>da</strong>ta resulting from our own thin film diffusion<br />

couples V/A1N. It is plausible that these assemblage <strong>da</strong>ta are associated with<br />

intermediate states approaching true equilibrium states. Details are given in two<br />

publications [97Du2, 97Du3] (see appendices Va and Vb)<br />

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