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1/29/98 78 C95.3-1991 Revision — 2 nd Draft<br />

10/98 Draft<br />

to eliminate this error) at each fixed point of interest within the spatial volume being<br />

surveyed. The minimum <strong>and</strong> maximum values should be recorded <strong>and</strong> an average value<br />

computed. This can be done manually in near-field situations, e.g., microwave oven<br />

surveys, without introducing error, if the surveyor’s h<strong>and</strong> is in an area of minimal field<br />

strength with respect to the field at the sensor (probe tip). In situations where uni<strong>for</strong>m<br />

illumination exists over the entire probe body (tip <strong>and</strong> h<strong>and</strong>le), larger errors are usually<br />

introduced by the presence of the operator’s h<strong>and</strong>, while per<strong>for</strong>ming this rotation, than are<br />

introduced by probe ellipticity. In this case, if precise data are required, the probe should<br />

be supported by a dielectric support <strong>and</strong> error limits associated with the probe ellipticity<br />

should be assigned to the measurement, rather than attempting to manually rotate the<br />

probe.<br />

5.3.6 Interaction of RF Hazard Probes with Nearby Passive Scattering Objects<br />

(Reradiators) <strong>and</strong> Active Radiators.<br />

When measurements are made with a hazard probe placed close to conducting or highdielectric-constant<br />

objects, (scatterers or ‘’passive reradiators’’) large errors may result.<br />

Two situations are addressed in this section. One situation occurs when a hazard probe<br />

with an ‘’electrically large’’ antenna (larger than about 0.25 wavelength) is placed close to<br />

field-perturbing objects such as a person’s body, or large conducting objects, e.g., a<br />

metal pole or metal shed. A second error-producing situation occurs when<br />

measurements are made with the probe antennas less than a few probe ‘’antennalengths’’<br />

or ‘’probe lengths’’ from an active RF radiator such as the monopole antenna of<br />

a mobile radio transmitter or a leaking microwave oven. (The term probe/antenna-length<br />

is discussed in 5.3.6.4.)<br />

Inaccurate per<strong>for</strong>mance of a hazard probe located near either passive reradiators or<br />

active radiators is due to several factors including the following:<br />

(1) Reflections from a reradiating object that produces st<strong>and</strong>ing-waves (or<br />

interference patterns in the EM-fields) that extend a distance of several<br />

wavelengths from the scatterer. When a probe is not tightly coupled (via the<br />

reactive near-fields of the reradiator), the techniques of 5.3.2 can be used to<br />

minimize measurement errors. These techniques remove the effects of<br />

st<strong>and</strong>ing-waves through the use of spatial averaging. When the probe is tightly<br />

coupled to the reradiator, the data in 5.3.6.1 can be used;<br />

(2) A perturbing object (whether it is an active radiator or a passive reradiator) ‘’loads’’<br />

or distorts the measurement characteristics of the probe’s antenna/detector<br />

combination [B106]. This occurs when the antenna is large compared with the<br />

wavelength of the RF energy being measured (5.3.6.1 addresses this situation);<br />

(3) An electrically large probe in the reactive near-field of an active radiator alters the<br />

fields being radiated by the source <strong>and</strong> spatially averages the nonuni<strong>for</strong>m near<br />

fields being measured. This averaging occurs over the effective aperture area of<br />

the probe antenna, i.e., dipole length or loop diameter.<br />

5.3.6.1 The Effects on Measurement Accuracy of the Separation Distance<br />

Between Survey Probes <strong>and</strong> Nearby Passive Radiators. An analysis can be<br />

per<strong>for</strong>med to determine the degree of probe interaction (or coupling) with nearby objects,<br />

such as passive reradiators or scatterers including exposed personnel. When a probe is<br />

Copyright © 1998 IEEE. All rights reserved. This is an unapproved IEEE St<strong>and</strong>ards Draft,<br />

subject to change.

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