Nanoforum - Nanotech Regulatory Document Archive

Competence centre's strategic development orientation No 2, objective of the
strategic development orientation
Nanotools
Development of technology for production of novel SPM probes. This includes but is not
limited to application of Focused Ion Beam technology to manufacture of SPM probes,
technology for sharpened probes with tip radius < 2 nm, probes with high aspect ratio,
cantilevers with attached Carbon Nanotube tips.
Development of techniques and specialised nanotools for analysis of nanostructures of
materials and their industrial applications, this includes analysis of molecular structure of
polymers in manufacturing, control of CD and DVD production processes,
nanoindentation of metals.
Competence centre's strategic development orientation No 3, objective of the
strategic development orientation
Nanometrology
Development of calibration techniques and calibration structures (micro and nano
standards) for quantitative analysis of nanoscale objects measured using various
microscopy methods, nanolithography and nanoindentation.
Development of the basic concepts for nanometrology
Development of specialised equipment and software in the scope of nanotechnology,
microscopy and microanalysis for educational purposes to be used in primary and
higher schools.
Contact person:
Director Pavel Kudensky
Phone: +372 61 43 117
Fax: +372 61 43 118
E-mail: pavelk@MikroMasch.com
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