DSS2015-final-lr

CONFERENCE 9483LOCATION: CONV. CTR. ROOM 329SESSION 6LOCATION: CONV. CTR. ROOM 329 ..........THU 10:40 AM TO 12:10 PMNovel Concepts IISession Chairs: Thomas W. Crowe, Virginia Diodes, Inc. (USA);B. M. Azizur Rahman, City Univ. London (United Kingdom)10:40 am: Extreme THz nonlinearities: high-harmonic generation, dynamicalBloch oscillations and interband Zener tunneling in bulk semiconductors(Invited Paper), Christoph Lange, Olaf Schubert, Matthias Hohenleutner, FabianLanger, Benedikt Urbanek, Univ. Regensburg (Germany); Ulrich Huttner, DanielGolde, Philipps-Univ. Marburg (Germany); Torsten Meier, Univ. Paderborn(Germany); Mackillo Kira, Stephan W. Koch, Philipps-Univ. Marburg (Germany);Rupert Huber, Univ. Regensburg (Germany). . . . . . . . . . . . . . . . . . . . . . [9483-17]11:10 am: A review on THz characterization of electronic componentsand a comparison of THz imaging characterization with other techniques(Invited Paper), Kiarash Ahi, Navid Asadizanjani, Sina Shahbazmohamadi, MarkTehranipoor, Mehdi Anwar, Univ. of Connecticut (USA) .............[9483-18]11:40 am: Solid state THz sources with higher power (Invited Paper),Thomas W Crowe, Steven A. Retzloff, Jeffrey L. Hesler, Virginia Diodes, Inc.(USA) ....................................................[9483-19]Lunch Break and Exhibition Time .................Thu 12:10 pm to 1:30 pmSESSION 7LOCATION: CONV. CTR. ROOM 329 ............THU 1:30 PM TO 3:20 PMTHz SpectroscopySession Chairs: Mehdi F. Anwar, Univ. of Connecticut (USA);Hiroshi Ito, Kitasato Univ. (Japan)1:30 pm: Nonlinear optical frequency up-conversion broadening terahertzhorizons in sensitive detection (Invited Paper), Kouji Nawata, Shin’ichiroHayashi, Hiroaki Minamide, RIKEN (Japan) ......................[9483-20]2:00 pm: Laminated materials characterization by terahertz kineticsspectroscopy, Anis Rahman, Aunik K. Rahman, Applied Research & Photonics,Inc. (USA).................................................[9483-21]2:20 pm: Experimental determination of terahertz atmospheric absorptionparameters, David M. Slocum, Thomas M. Goyette, Robert H. Giles, Univ. ofMassachusetts Lowell (USA); William E. Nixon, National Ground Intelligence Ctr.(USA) ....................................................[9483-22]2:40 pm: Possibility of the detection and identification of substance atlong distance using the noisy reflected THz pulse under real conditions,Vyacheslav A. Trofimov, Svetlana A. Varentsova, Vladislav V. Trofimov,Lomonosov Moscow State Univ. (Russian Federation) .............[9483-23]3:00 pm: THz magneto-photoresponse spectroscopy of HgTe basedquantum well (gapped Dirac type electronic dispersion), Mehdi Pakmehr,Univ. at Buffalo (USA); Christoph Bruene, Laurens W. Molenkamp, Julius-Maximilians-Univ. Würzburg (Germany); Bruce D. McCombe, Univ. at Buffalo(USA) ....................................................[9483-24]Coffee Break ..................................Thu 3:20 pm to 3:50 pmSESSION 8LOCATION: CONV. CTR. ROOM 329 ............THU 3:50 PM TO 5:20 PMTHz ImagingSession Chairs: Thomas W. Crowe, Virginia Diodes, Inc. (USA);B. M. Azizur Rahman, City Univ. London (United Kingdom)3:50 pm: Room temperature terahertz detectors and their applications(Invited Paper), Jian Chen, Xuecou Tu, Lin Kang, Biaobing Jin, Peiheng Wu,Nanjing Univ. (China)........................................[9483-25]4:20 pm: Performances of THz cameras with enhanced sensitivity in subterahertzregion, Naoki Oda, Tsutomu Ishi, Seiji Kurashina, Takayuki Sudou,Takao Morimoto, Masaru Miyoshi, Kohei Doi, Hideki Goto, Tokuhito Sasaki,NEC Corp. (Japan); Goro Isoyama, Ryukou Kato, Akinori Irizawa, Keigo Kawase,The Institute of Scientific and Industrial Research (Japan) ...........[9483-26]4:40 pm: Robust identification of concealed dangerous substances usingTHz imaging spectroscopy, Arthur D. van Rheenen, Magnus W. Haakestad,Norwegian Defence Research Establishment (Norway); Helle E. Nystad,Norwegian Univ. of Science and Technology (Norway) .............[9483-29]5:00 pm: Dark field THz camera imaging measurements, 200 GHz to 400GHz, Andrew P. Sacco, J. Daniel Newman, Exelis Geospatial Systems (USA);Paul P. K. Lee, Univ. of Rochester (USA); Kenneth D. Fourspring, John H.Osborn, Robert D. Fiete, Exelis Geospatial Systems (USA); Mark F. Bocko,Zeljko Ignjatovic, Judith L. Pipher, Craig W. McMurtry, Xi-Cheng Zhang,Jagannath Dayalu, Univ. of Rochester (USA); Katherine Seery, Chao Zhang,Zoran Ninkov, Rochester Institute of Technology (USA).............[9483-30]INTERACTIVE POSTER SESSION: THURSDAY EVENINGLOCATION: CONV. CTR. LEVEL 200 MEZZANINE . .THU 6:00 TO 7:30 PMAll symposium attendees – You are invited to attend the evening Interactive PosterSession to view the high-quality posters and engage the authors in discussion.Enjoy light refreshments while networking with colleagues in your field. Authorsmay set up their posters between 7:30 am and 12:00 noon the day of their postersession. Special daytime previewing prior to the session from 12:00 noon to4:30 pm. Attendees are required to wear their conference registration badges toaccess Level 200, Mezzanine to view the posters.Posters that are not set up by the 5:00 pm cut-off time will be considered noshows,and their manuscripts may not be published. Poster authors shouldaccompany their posters from 6:00 to 7:30 pm to answer questions fromattendees. All posters and other materials must be removed no later than 8:00pm. Any posters or materials left behind at the close of the poster session will beconsidered unwanted and will be discarded. SPIE assumes no responsibility forposters left up after the end of each poster session.MCT as sub-terahertz and infrared detector, Fiodor F. Sizov, VyacheslavV. Zabudsky, V.E. Lashkaryov Institute of Semiconductor Physics (Ukraine);Sergey A. Dvoretsky, A.V. Rzhanov Institute of Semiconductor Physics(Russian Federation); Vladimir A. Petryiakov, Aleksandr G. Golenkov, KaterinaV. Andreyeva, Zinoviia F. Tsybrii, Anna V. Shevchik-Shekera, V.E. LashkaryovInstitute of Semiconductor Physics (Ukraine); Ernesto Dieguez, Univ. Autónomade Madrid (Spain) ..........................................[9483-27]Inspection of mechanical and electrical properties of silicon wafersusing terahertz tomography and spectroscopy, Thomas Arnold, WolfgangMühleisen, Johannes Schicker, Christina Hirschl, Raimund Leitner, CarinthianTech Research AG (Austria) ..................................[9483-31]Variation of ZnMgO properties upon growth technique in THz spectrum,Abdiel Rivera, Anas Mazady, Kiarash Ahi, Mehdi Anwar, Univ. of Connecticut(USA) ....................................................[9483-32]124 SPIE DSS 2015 · www.spie.org/dss