DSS2015-final-lr

CONFERENCE 9489LOCATION: CONV. CTR. ROOM 331DSS PLENARY PRESENTATION .. MON 5:00 PM TO 6:00 PMLOCATION: CONV. CTR. BALLROOM 1, LEVEL 4Emerging Research and Engineering Capabilitiesfor NextGen WarfightersALAN R. SHAFFERPrincipal Deputy Assistant Secretary ofDefense Research and EngineeringDepartment of DefenseSee details page 9TUESDAY 21 APRILSESSION 5LOCATION: CONV. CTR. ROOM 331 ...........TUE 8:30 AM TO 12:10 PM3D and Imaging MethodsSession Chair: Kevin G. Harding, GE Global Research (USA)8:30 am: Measuring accuracy of in-plane and out-of-plane deformationssimultaneous measurement of speckle interferometry using multirecordingmethod (Invited Paper), Yasuhiko Arai, Kansai Univ.(Japan)...................................................[9489-14]9:00 am: Long wave infrared 3D scanner, Ernst Wiedenmann, Robert Schott,Jan Tusch, Andreas Wolf, Aimess Services GmbH (Germany)........[9489-15]9:20 am: Terahertz reflection interferometry for automobile paint layerthickness measurement, Aunik K. Rahman, Applied Research & Photonics,Inc. (USA); Kenneth B. Tator, KTA-Tator, Inc. (USA); Anis Rahman, AppliedResearch & Photonics, Inc. (USA)..............................[9489-16]9:40 am: Quantitative imaging of open-circuit voltage in opto-electronicdevices with nanoscale resolution, Elizabeth Tennyson, Joseph Garrett, Univ.of Maryland, College Park (USA); Jesse A. Frantz, Jason D. Myers,Robel Y. Bekele, U.S. Naval Research Lab. (USA); Jasbinder S. Sanghera, Univ.Research Foundation (USA) and U.S. Naval Research Lab. (USA); Jeremy N.Munday, Marina S. Leite, Univ. of Maryland, College Park (USA)......[9489-17]10:00 am: Application of holographic interferometry to in-plane andout-of-plane misalignment and deformation measurements in packagingapplications, Vladimir V. Nikulin, Rahul M. Khandekar, Vijit Bedi, BinghamtonUniv. (USA) ...............................................[9489-18]Coffee Break ................................ Tue 10:20 am to 10:50 am10:50 am: Real-time and uniaxial microscopic measurement of 3D profileby polarization grating, Yukitoshi Otani, Shuhei Shibata, Daisuke Barada,Utsunomiya Univ. (Japan) ....................................[9489-19]11:10 am: 3D position tracking for borescope inspections, Kevin G. Harding,GE Global Research (USA); Yong Yang, GE Global Research (China);Guiju Song, GE Global Research (USA) .........................[9489-20]11:30 am: Small hole inner profile measurement method, Yi Liao,Kevin G. Harding, Rajesh Ramamurthy, GE Global Research (USA) ...[9489-21]11:50 am: High contrast imaging in the presence of a bright background,Harbans S. Dhadwal, Jahangir Rastegar, Dake Feng, Omnitek Partners, LLC(USA) ....................................................[9489-22]INTERACTIVE POSTER SESSION: TUESDAY EVENINGLOCATION: CONV. CTR. LEVEL 200 MEZZANINE ...TUE 6:00 TO 7:30 PMAll symposium attendees – You are invited to attend the evening Interactive PosterSession to view the high-quality posters and engage the authors in discussion.Enjoy light refreshments while networking with colleagues in your field. Authorsmay set up their posters between 7:30 am and 12:00 noon the day of their postersession. Special daytime previewing prior to the session from 12:00 noon to4:30 pm. Attendees are required to wear their conference registration badges toaccess Level 200, Mezzanine to view the posters.Posters that are not set up by the 5:00 pm cut-off time will be considered noshows,and their manuscripts may not be published. Poster authors shouldaccompany their posters from 6:00 to 7:30 pm to answer questions fromattendees. All posters and other materials must be removed no later than 8:00pm. Any posters or materials left behind at the close of the poster session will beconsidered unwanted and will be discarded. SPIE assumes no responsibility forposters left up after the end of each poster session.The omni-directional image assisted optical surveillance system,Yung-Hsiang Chen, National Applied Research Labs. (Taiwan) and NationalTsing Hua Univ. (Taiwan); Chi-Hung Hwang, National Applied Research Labs.(Taiwan); Wei-Chung Wang, National Tsing Hua Univ. (Taiwan); Chun-Fu Lin,National Applied Research Labs. (Taiwan) .......................[9489-23]140 SPIE DSS 2015 · www.spie.org/dss