Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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<strong>Burn</strong>-<strong>in</strong> & <strong>Test</strong> <strong>Socket</strong><br />
<strong>Workshop</strong><br />
Technical Program<br />
Session 7<br />
Wednesday 3/06/02 8:00AM<br />
<strong>Burn</strong>-<strong>in</strong> Board Design<br />
“<strong>Burn</strong>-<strong>in</strong> Board Over-current Protection – What Are The Options?”<br />
KW Low - Intel Corporation<br />
Zamel Jaafar - Intel Corporation<br />
“Protect<strong>in</strong>g Conductor Pads On <strong>Burn</strong>-<strong>in</strong> Boards From Oxidation And<br />
Corrosion”<br />
Alfred Sugarman - Loranger International Corporation<br />
Al Loranger - Loranger International Corporation<br />
“Power Decoupl<strong>in</strong>g Optimizer – A Systematic Frequency Doma<strong>in</strong> Approach To<br />
BiB Noise Decoupl<strong>in</strong>g Simulation”<br />
Isaac Chang - Intel Corporation