Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
Burn-in & Test Socket Workshop - BiTS Workshop
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Introduction<br />
• Exist<strong>in</strong>g Time Doma<strong>in</strong>(TD) methodology of<br />
power noise decoupl<strong>in</strong>g is critical for<br />
ensur<strong>in</strong>g stable/consistent power delivery for<br />
<strong>Burn</strong>-In Board(BIB) operation.<br />
– Utilizes a full system power delivery model and<br />
simulated us<strong>in</strong>g PSPICE software <strong>in</strong> TD us<strong>in</strong>g trial-<br />
&-error approach.<br />
– Requires numerous tedious iterations to<br />
determ<strong>in</strong>e the optimized decoupl<strong>in</strong>g capacitance.<br />
– Several major drawbacks <strong>in</strong> predict<strong>in</strong>g the<br />
decoupl<strong>in</strong>g requirements with the<br />
selective/appropriate capacitors <strong>in</strong> term of types<br />
and quantities effectively/accurately.<br />
02/01/2002 <strong>BiTS</strong> 2002 4
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